Single Event Transients in Logic Circuits—Load and Propagation Induced Pulse Broadening

Gilson Wirth; Fernanda L Kastensmidt; Ivandro Ribeiro

doi:10.1109/tns.2008.2006265

Single Event Transients in Logic Circuits—Load and Propagation Induced Pulse Broadening

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2008.2006265 ◽

2008 ◽

Vol 55 (6) ◽

pp. 2928-2935 ◽

Cited By ~ 51

Author(s):

Gilson Wirth ◽

Fernanda L Kastensmidt ◽

Ivandro Ribeiro

Keyword(s):

Logic Circuits ◽

Single Event ◽

Single Event Transients ◽

Pulse Broadening

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An Efficient Design of Single Event Transients Tolerance for Logic Circuits

4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) ◽

10.1109/delta.2008.9 ◽

2008 ◽

Cited By ~ 4

Author(s):

Yantu Mo ◽

Suge Yue

Keyword(s):

Logic Circuits ◽

Single Event ◽

Efficient Design ◽

Single Event Transients

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A Detailed Characterization of Errors in Logic Circuits due to Single-Event Transients

2015 Euromicro Conference on Digital System Design ◽

10.1109/dsd.2015.58 ◽

2015 ◽

Cited By ~ 3

Author(s):

Nanditha P. Rao ◽

Madhav P. Desai

Keyword(s):

Logic Circuits ◽

Single Event ◽

Detailed Characterization ◽

Single Event Transients

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Radiation hardened by design technique to mitigate single event transients in combinational logic circuits

2017 International Conference on Recent Innovations in Signal processing and Embedded Systems (RISE) ◽

10.1109/rise.2017.8378178 ◽

2017 ◽

Cited By ~ 2

Author(s):

Tokala Vinay Reddy ◽

Sangeeta Nakhate

Keyword(s):

Logic Circuits ◽

Combinational Logic ◽

Single Event ◽

Design Technique ◽

Single Event Transients ◽

Radiation Hardened ◽

Combinational Logic Circuits ◽

Radiation Hardened By Design

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Automated analysis of propagation induced pulse broadening of single event transients

2016 31st Symposium on Microelectronics Technology and Devices (SBMicro) ◽

10.1109/sbmicro.2016.7731337 ◽

2016 ◽

Cited By ~ 1

Author(s):

Gilson Wirth ◽

Michele Vieira

Keyword(s):

Automated Analysis ◽

Single Event ◽

Single Event Transients ◽

Pulse Broadening

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Design sensitivity of single event transients in scaled logic circuits

Proceedings of the 48th Design Automation Conference on - DAC '11 ◽

10.1145/2024724.2024881 ◽

2011 ◽

Cited By ~ 11

Author(s):

Jyothi Velamala ◽

Robert LiVolsi ◽

Myra Torres ◽

Yu Cao

Keyword(s):

Design Sensitivity ◽

Logic Circuits ◽

Single Event ◽

Single Event Transients

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Single-Event Pulse Broadening After Narrowing Effect in Nano-CMOS Logic Circuits

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2014.2330841 ◽

2014 ◽

Vol 14 (3) ◽

pp. 849-856 ◽

Cited By ~ 13

Author(s):

Pengcheng Huang ◽

Shuming Chen ◽

Jianjun Chen ◽

Bin Liang ◽

Biwei Liu

Keyword(s):

Logic Circuits ◽

Single Event ◽

Pulse Broadening

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Impact of negative bias temperature instability on single event transients in scaled logic circuits

International Journal of Numerical Modelling Electronic Networks Devices and Fields ◽

10.1002/jnm.2854 ◽

2021 ◽

Author(s):

Ambika Prasad Shah ◽

Michael Waltl

Keyword(s):

Logic Circuits ◽

Negative Bias ◽

Single Event ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Single Event Transients

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Features of single event transients in CMOS combinational logic circuits caused by charge collection from tracks of single nuclear particles

Problems of advanced micro- and nanoelectronic systems development ◽

10.31114/2078-7707-2020-2-95-102 ◽

2020 ◽

pp. 95-102

Author(s):

Yu.V. Katunin ◽

V.Ya. Stenin ◽

◽

Keyword(s):

Logic Circuits ◽

Charge Collection ◽

Combinational Logic ◽

Single Event ◽

Single Event Transients ◽

Combinational Logic Circuits

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Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2008.2007724 ◽

2008 ◽

Vol 55 (6) ◽

pp. 2842-2853 ◽

Cited By ~ 91

Author(s):

V. Ferlet-Cavrois ◽

V. Pouget ◽

D. McMorrow ◽

J. R. Schwank ◽

N. Fel ◽

...

Keyword(s):

Single Event ◽

Single Event Transients ◽

Pulse Broadening

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Optical Single-Event Transients Induced in Integrated Silicon-Photonic Waveguides by Two-Photon Absorption

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2021.3051802 ◽

2021 ◽

pp. 1-1

Author(s):

George N. Tzintzarov ◽

Adrian Ildefonso ◽

Jeffrey W. Teng ◽

Milad Frounchi ◽

Albert Djikeng ◽

...

Keyword(s):

Photon Absorption ◽

Single Event ◽

Two Photon Absorption ◽

Two Photon ◽

Single Event Transients ◽

Silicon Photonic ◽

Photonic Waveguides

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