Random and systematic uncertainties of reflection-type Q-factor measurement with network analyzer

2003 ◽  
Vol 51 (2) ◽  
pp. 512-519 ◽  
Author(s):  
D. Kajfez
Keyword(s):  
Network Analyzer ◽  
Q Factor ◽  
Systematic Uncertainties ◽  
Factor Measurement

AC Loss Modeling in Ba0.5Sr0.5TiO3 Using Dielectric Relaxation

2004 ◽  
Vol 833 ◽  
Author(s):  
Nadia K. Pervez ◽  
Jiwei Lu ◽  
Susanne Stemmer ◽  
Robert A. York
Keyword(s):  
Dielectric Loss ◽  
Dielectric Relaxation ◽  
Power Law ◽  
Fractional Power ◽  
Ac Loss ◽  
Dielectric Susceptibility ◽  
Network Analyzer ◽  
Q Factor ◽  
Relaxation Model ◽  
Q Factors

ABSTRACTIn universal relaxation, a material's complex dielectric susceptibility follows a fractional power law f1-n where 0 < n < 1 over multiple decades of frequency. In a variety of materials, including Ba0.5Sr0.5Ti03, dielectric relaxation has been observed to follow this universal relaxation model with values of n close to 1. In this work we have shown that the universal relaxation model can be used to calculate dielectric loss even when n is very close to 1. Our calculated Q-factors agree with measured values at 1 MHz; this agreement suggests that this technique may be used for higher frequencies where network analyzer measurements and electrode parasitics complicate Q-factor determination.

scholarly journals Improvement of the Q-factor measurement in RF cavities

2012 ◽  
Author(s):  
Xu W. ◽  
S. Belomestnykh ◽  
I. Ben-Zvi ◽  
H. Hahn
Keyword(s):  
Q Factor ◽  
Rf Cavities ◽  
Factor Measurement

METHOD FOR MEASURING THE EQUIVALENT PARAMETERS OF INDUCTORS AS PART OF LOW-PASS FILTERS

2020 ◽  
pp. 19-29
Author(s):  
A. G. Zinovev ◽  
I. A. Shestakov
Keyword(s):  
The Self ◽  
Network Analyzer ◽  
Q Factor ◽  
Practical Application ◽  
Pass Filter ◽  
Low Pass Filter ◽  
Loss Resistance ◽  
Low Pass ◽  
Low Pass Filters ◽  
Fifth Order

A method for measuring the self-capacitance, inductance, loss resistance, and Q-factor of inductors as part of an LC low-pass filter at its operating frequency is presented. An example of the practical application of this method for measuring the equivalent pa-rameters of inductors and capacitors as part of a fifth-order Cauer low-pass filter using network analyzer.

scholarly journals Q-factor measurement of nonlinear superconducting resonators

2000 ◽  
Vol 36 (3) ◽  
pp. 271 ◽  
Author(s):  
X.S. Rao ◽  
C.K. Ong ◽  
Y.P. Feng
Keyword(s):  
Q Factor ◽  
Superconducting Resonators ◽  
Factor Measurement

A-posteriori Estimation of Random Uncertainty for the Reflection Type Q-factor Measurements

2020 ◽  
Vol 35 (10) ◽  
pp. 1105-1112
Author(s):  
Darko Kajfez
Keyword(s):  
Measurement Procedure ◽  
Q Factor ◽  
A Posteriori ◽  
Fitting Procedure ◽  
Uncertainty Estimates ◽  
Factor Measurement ◽  
Novel Method ◽  
Accuracy Of Results ◽  
Q Factors ◽  
Posteriori Estimation

A frequently used Q factor measurement procedure consists of determining the values of the input reflection coefficient vs. frequency with the use of a network analyzer, and processing the measured values with a data-fitting procedure to evaluate the location and the size of the corresponding Q-circle. That information is then used to compute the value of the loaded and unloaded Q factors and the coupling coefficient of the resonator being tested. This paper describes a novel method of post-processing the measured data, which also provides information on the uncertainty of the obtained results. Numerical examples show that this a-posteriori procedure can not only provide the uncertainty estimates but also improve the accuracy of results, even in the presence of a significant level of random measurement noise.

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