Improved Shielding Performance Using High Permeability Electroplated Thin Films in Printed Circuit Boards

2011 ◽  
Vol 47 (10) ◽  
pp. 4282-4285 ◽  
Author(s):  
Maeve Duffy ◽  
Santosh Kulkarni ◽  
Saibal Roy
1990 ◽  
Vol 188 ◽  
Author(s):  
Richard Haynes

1. IntroductionIn VLSI processing and other applications such as printed circuit boards thin films of copper, usually used as conductors, undergo thermal cycling. This thermal cycling can cause loss of adhesion and mechanical failures thus decreasing reliability of the devices[l–7]. Understanding thermally induced stress due to mismatch of thermal expansion may assist in generating designs, processes and material replacement for increased reliability. This paper reports studies of the temperature dependence of stresses for plated and sputtered copper and plated copper-silver and copper-tin alloys. Studies of thermally annealed plated copper and copper-tin alloys are also reported.


2006 ◽  
Vol 16 (4) ◽  
pp. 581-585 ◽  
Author(s):  
C. K. Tan ◽  
Gregory K. L. Goh ◽  
D. Z. Chi ◽  
Albert C. W. Lu ◽  
B. K. Lok

2008 ◽  
Vol 128 (11) ◽  
pp. 657-662 ◽  
Author(s):  
Tsuyoshi Maeno ◽  
Yukihiko Sakurai ◽  
Takanori Unou ◽  
Kouji Ichikawa ◽  
Osamu Fujiwara

2018 ◽  
Vol 23 (2) ◽  
pp. 141-148
Author(s):  
S.Sh. Rekhviashvili ◽  
◽  
M.O. Mamchuev ◽  
V.V. Narozhnov ◽  
M.M. Oshkhunov ◽  
...  

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