A study of high-frequency characteristics of write heads with the ac-phase high-frequency magnetic force microscope

M. Abe; Y. Tanaka

doi:10.1109/tmag.2002.988909

A study of high-frequency characteristics of write heads with the ac-phase high-frequency magnetic force microscope

IEEE Transactions on Magnetics ◽

10.1109/tmag.2002.988909 ◽

2002 ◽

Vol 38 (1) ◽

pp. 45-49 ◽

Cited By ~ 27

Author(s):

M. Abe ◽

Y. Tanaka

Keyword(s):

High Frequency ◽

Magnetic Force ◽

Frequency Characteristics ◽

Magnetic Force Microscope ◽

Write Heads

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High Frequency Magnetic Force Microscopy-Imaging of Harddisk Write Heads

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.2238 ◽

2006 ◽

Vol 45 (3B) ◽

pp. 2238-2241 ◽

Cited By ~ 26

Author(s):

Michael R. Koblischka ◽

Jian-Dong Wei ◽

Michael Kirsch ◽

Uwe Hartmann

Keyword(s):

High Frequency ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Microscopy Imaging ◽

Force Microscopy ◽

Write Heads

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High frequency write head measurement with the phase detection magnetic force microscope

Journal of Applied Physics ◽

10.1063/1.1359232 ◽

2001 ◽

Vol 89 (11) ◽

pp. 6766-6768 ◽

Cited By ~ 19

Author(s):

M. Abe ◽

Y. Tanaka

Keyword(s):

High Frequency ◽

Magnetic Force ◽

Magnetic Force Microscope ◽

Phase Detection

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Direct observation of the high frequency write response of recording heads using the magnetic force microscope (abstract)

Journal of Applied Physics ◽

10.1063/1.364936 ◽

1997 ◽

Vol 81 (8) ◽

pp. 4522-4522 ◽

Cited By ~ 3

Author(s):

Roger Proksch ◽

Jake Schmidt ◽

Shane Austvold ◽

George Skidmore

Keyword(s):

Direct Observation ◽

High Frequency ◽

Magnetic Force ◽

Magnetic Force Microscope ◽

Write Response ◽

Recording Heads

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Multiple domain structure and symmetry types in narrow temperature and magnetic field ranges in layered Cr2Ge2Te6 crystal measured by magnetic force microscope

Materials Characterization ◽

10.1016/j.matchar.2021.110913 ◽

2021 ◽

Vol 173 ◽

pp. 110913

Author(s):

Tengfei Guo ◽

Zongwei Ma ◽

Xuan Luo ◽

Yubin Hou ◽

Wenjie Meng ◽

...

Keyword(s):

Magnetic Field ◽

Domain Structure ◽

Magnetic Force ◽

Magnetic Force Microscope ◽

Multiple Domain

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Analysis of High Frequency Characteristics for a Meander Line Slow-wave Structure

10.1109/ivec45766.2020.9520615 ◽

2020 ◽

Author(s):

Zheng Wen ◽

Jirun Luo ◽

Yu Fan ◽

Chen Yang ◽

Fang Zhu ◽

...

Keyword(s):

Slow Wave ◽

High Frequency ◽

Wave Structure ◽

Slow Wave Structure ◽

Frequency Characteristics ◽

Meander Line

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Fabrication of Magnetic Tips for High-Resolution Magnetic Force Microscopy

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.543.35 ◽

2013 ◽

Vol 543 ◽

pp. 35-38 ◽

Cited By ~ 2

Author(s):

Masaaki Futamoto ◽

Tatsuya Hagami ◽

Shinji Ishihara ◽

Kazuki Soneta ◽

Mitsuru Ohtake

Keyword(s):

Magnetic Material ◽

High Resolution ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Magnetic Force Microscope ◽

Force Microscopy ◽

High Magnetic Moment ◽

Tip Radius ◽

Better Than ◽

Sputtering System

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.

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