Direct observation of the high frequency write response of recording heads using the magnetic force microscope (abstract)

1997 ◽  
Vol 81 (8) ◽  
pp. 4522-4522 ◽  
Author(s):  
Roger Proksch ◽  
Jake Schmidt ◽  
Shane Austvold ◽  
George Skidmore
Keyword(s):  
Direct Observation ◽  
High Frequency ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Write Response ◽  
Recording Heads

Characterization of high density spin valve recording heads by novel magnetic force microscope

1999 ◽  
Vol 35 (5) ◽  
pp. 2625-2627 ◽  
Author(s):  
C.X. Qian ◽  
H.C. Tong ◽  
F.H. Liu ◽  
X. Shi ◽  
S. Dey ◽  
...  
Keyword(s):  
Magnetic Force ◽  
Spin Valve ◽  
High Density ◽  
Magnetic Force Microscope ◽  
Recording Heads

Measuring the gigahertz response of recording heads with the magnetic force microscope

1999 ◽  
Vol 74 (9) ◽  
pp. 1308-1310 ◽  
Author(s):  
Roger Proksch ◽  
Peter Neilson ◽  
Shane Austvold ◽  
J. J. Schmidt
Keyword(s):  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Recording Heads

Fabrication of Magnetic Tips for High-Resolution Magnetic Force Microscopy

2013 ◽  
Vol 543 ◽  
pp. 35-38 ◽  
Author(s):  
Masaaki Futamoto ◽  
Tatsuya Hagami ◽  
Shinji Ishihara ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake
Keyword(s):  
Magnetic Material ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Force Microscopy ◽  
High Magnetic Moment ◽  
Tip Radius ◽  
Better Than ◽  
Sputtering System

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.

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