scholarly journals Uncertainty Analysis of Stray Field Measurements by Quantitative Magnetic Force Microscopy

2020 ◽  
pp. 1-1 ◽  
Author(s):  
Xiukun Hu ◽  
Gaoliang Dai ◽  
Sibylle Sievers ◽  
Alexander Fernandez Scarioni ◽  
Volker Neu ◽  
...  
Keyword(s):  
Uncertainty Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Field Measurements ◽  
Stray Field ◽  
Force Microscopy

scholarly journals Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy

2020 ◽  
Vol 511 ◽  
pp. 166947
Author(s):  
Xiukun Hu ◽  
Gaoliang Dai ◽  
Sibylle Sievers ◽  
Alexander Fernández-Scarioni ◽  
Héctor Corte-León ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Field Measurements ◽  
Round Robin ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Magnetic Field Measurements

scholarly journals A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

2021 ◽  
Vol 7 (6) ◽  
pp. 78
Author(s):  
Baha Sakar ◽  
Sibylle Sievers ◽  
Alexander Fernández Scarioni ◽  
Felipe Garcia-Sanchez ◽  
İlker Öztoprak ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Reference Sample ◽  
Image Data ◽  
Stray Field ◽  
Magnetization Distribution ◽  
Finite Width ◽  
Stripe Domain ◽  
Micromagnetic Simulations ◽  
Force Microscopy

Magnetic force microscopy (MFM) is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative (qMFM) spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack that shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process, combined with a characterization of the sample micromagnetic parameters, allows reliable calculation of the sample’s magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated, and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed.

scholarly journals A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

2021 ◽  
Author(s):  
Baha Sakar ◽  
Sibylle Sievers ◽  
Alexander Fernández Scarioni ◽  
Felipe Garcia-Sanchez ◽  
İlker Öztoprak ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Reference Sample ◽  
Image Data ◽  
Stray Field ◽  
Magnetization Distribution ◽  
Finite Width ◽  
Stripe Domain ◽  
Micromagnetic Simulations ◽  
Force Microscopy

Magnetic force microscopy (MFM) is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative (qMFM) spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack which shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process combined with a characterization of the sample micromagnetic parameters allows to reliably calculate the sample’s magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed.

Magnetic force microscopy

1991 ◽  
Vol 49 ◽  
pp. 768-769
Author(s):  
P. Grütter ◽  
D. Rugar ◽  
H.-J. Mamin ◽  
T.R. Albrecht
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Central Component ◽  
Stray Field ◽  
Short Introduction ◽  
Present Measurement ◽  
Cantilever Deflection ◽  
Magnetic Structures ◽  
Force Microscopy ◽  
Non Destructive

The aim of this talk is to give a short introduction to the technique of magnetic force microscopy (MFM), review recent advances in instrumentation and present measurement on various magnetic materials.MFM [1, 2] is a non-destructive method which allows the imaging of magnetic structures with little or no sample preparation on a 50-100 nm scale. The central component of every MFM is a sharp magnetic tip mounted on a flexible cantilever. The interaction of the magnetic tip with a sample stray field leads to a change of both cantilever deflection and resonant frequency. These changes are measured with a sensitive displacement probe, eg. an interferometer. Images are generated by raster scanning the sample relative to the tip and recording the tip-sample interaction as a function of position.

Sign in / Sign up

Export Citation Format

Share Document