Models for the stray field from magnetic tips used in magnetic force microscopy

1992 ◽  
Vol 72 (1) ◽  
pp. 203-206 ◽  
Author(s):  
A. Wadas ◽  
H. J. Hug
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Stray Field ◽  
Force Microscopy

scholarly journals Uncertainty Analysis of Stray Field Measurements by Quantitative Magnetic Force Microscopy

2020 ◽  
pp. 1-1 ◽  
Author(s):  
Xiukun Hu ◽  
Gaoliang Dai ◽  
Sibylle Sievers ◽  
Alexander Fernandez Scarioni ◽  
Volker Neu ◽  
...  
Keyword(s):  
Uncertainty Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Field Measurements ◽  
Stray Field ◽  
Force Microscopy

scholarly journals A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

2021 ◽  
Vol 7 (6) ◽  
pp. 78
Author(s):  
Baha Sakar ◽  
Sibylle Sievers ◽  
Alexander Fernández Scarioni ◽  
Felipe Garcia-Sanchez ◽  
İlker Öztoprak ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Reference Sample ◽  
Image Data ◽  
Stray Field ◽  
Magnetization Distribution ◽  
Finite Width ◽  
Stripe Domain ◽  
Micromagnetic Simulations ◽  
Force Microscopy

Magnetic force microscopy (MFM) is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative (qMFM) spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack that shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process, combined with a characterization of the sample micromagnetic parameters, allows reliable calculation of the sample’s magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated, and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed.

scholarly journals A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

2021 ◽  
Author(s):  
Baha Sakar ◽  
Sibylle Sievers ◽  
Alexander Fernández Scarioni ◽  
Felipe Garcia-Sanchez ◽  
İlker Öztoprak ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Reference Sample ◽  
Image Data ◽  
Stray Field ◽  
Magnetization Distribution ◽  
Finite Width ◽  
Stripe Domain ◽  
Micromagnetic Simulations ◽  
Force Microscopy

Magnetic force microscopy (MFM) is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative (qMFM) spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack which shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process combined with a characterization of the sample micromagnetic parameters allows to reliably calculate the sample’s magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed.

Magnetic force microscopy

1991 ◽  
Vol 49 ◽  
pp. 768-769
Author(s):  
P. Grütter ◽  
D. Rugar ◽  
H.-J. Mamin ◽  
T.R. Albrecht
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Central Component ◽  
Stray Field ◽  
Short Introduction ◽  
Present Measurement ◽  
Cantilever Deflection ◽  
Magnetic Structures ◽  
Force Microscopy ◽  
Non Destructive

The aim of this talk is to give a short introduction to the technique of magnetic force microscopy (MFM), review recent advances in instrumentation and present measurement on various magnetic materials.MFM [1, 2] is a non-destructive method which allows the imaging of magnetic structures with little or no sample preparation on a 50-100 nm scale. The central component of every MFM is a sharp magnetic tip mounted on a flexible cantilever. The interaction of the magnetic tip with a sample stray field leads to a change of both cantilever deflection and resonant frequency. These changes are measured with a sensitive displacement probe, eg. an interferometer. Images are generated by raster scanning the sample relative to the tip and recording the tip-sample interaction as a function of position.

Imaging, Manipulation, and Spectroscopic Measurements of Nanomagnets by Magnetic Force Microscopy

MRS Bulletin ◽  
2004 ◽  
Vol 29 (7) ◽  
pp. 457-462 ◽  
Author(s):  
Xiaobin Zhu ◽  
Peter Grütter
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Particles ◽  
Magnetic Force ◽  
Operation Mode ◽  
Hysteresis Loops ◽  
Hysteresis Curve ◽  
Stray Field ◽  
Small Particles ◽  
Spectroscopic Measurements ◽  
Force Microscopy

AbstractMagnetic force microscopy (MFM) is a well-established technique for imaging the magnetic structures of small magnetic particles. In cooperation with external magnetic fields, MFM can be used to study the magnetization switching mechanism of submicrometer-sized magnetic particles. Various MFM techniques allow the measurement of a hysteresis curve of an individual particle, which can then be compared to ensemble measurements. The advantage of using MFM-constructed hysteresis loops is that one can in principle understand the origin of dispersion in switching fields. It is also possible to directly observe the correlation between magnetic particles through careful imaging and control of the external magnetic field. In all of these measurements, attention needs to be paid to avoid artifacts that result from the unavoidable magnetic tip stray field. Control can be achieved by optimizing the MFM operation mode as well as the tip parameters. It is even possible to use the tip stray field to locally and reproducibly manipulate the magnetic-moment state of small particles. In this article, we illustrate these concepts and issues by studying various lithographically patterned magnetic nanoparticles, thus demonstrating the versatility of MFM for imaging, manipulation, and spectroscopic measurements of small particles.

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