Depth Resolution Enhancement in Time-of-Flight Cameras Using Polarization State of the Reflected Light

2019 ◽  
Vol 68 (1) ◽  
pp. 160-168 ◽  
Author(s):  
Aniket Dashpute ◽  
Chandani Anand ◽  
Mukul Sarkar
Keyword(s):  
Polarization State ◽  
Resolution Enhancement ◽  
Time Of Flight ◽  
Depth Resolution ◽  
Reflected Light

Depth Resolution Enhancement Technique for CMOS Time-of-Flight 3-D Image Sensors

2012 ◽  
Vol 12 (6) ◽  
pp. 2320-2327 ◽  
Author(s):  
Mohamed Lamine Hafiane ◽  
Wilfried Wagner ◽  
Zohir Dibi ◽  
Otto Manck
Keyword(s):  
Resolution Enhancement ◽  
Time Of Flight ◽  
Depth Resolution ◽  
Image Sensors ◽  
Enhancement Technique ◽  
Resolution Enhancement Technique

scholarly journals Electrical tuning of the polarization state of light using graphene-integrated anisotropic metasurfaces

2017 ◽  
Vol 375 (2090) ◽  
pp. 20160061 ◽  
Author(s):  
Shourya Dutta-Gupta ◽  
Nima Dabidian ◽  
Iskandar Kholmanov ◽  
Mikhail A. Belkin ◽  
Gennady Shvets
Keyword(s):  
Tilt Angle ◽  
Incident Light ◽  
Polarization State ◽  
Dynamic Control ◽  
Single Layer ◽  
Single Layer Graphene ◽  
Dynamic Polarization ◽  
Reflected Light ◽  
Electro Optic ◽  
The Way

Plasmonic metasurfaces have been employed for moulding the flow of transmitted and reflected light, thereby enabling numerous applications that benefit from their ultra-thin sub-wavelength format. Their appeal is further enhanced by the incorporation of active electro-optic elements, paving the way for dynamic control of light's properties. In this paper, we realize a dynamic polarization state generator using a graphene-integrated anisotropic metasurface (GIAM) that converts the linear polarization of the incident light into an elliptical one. This is accomplished by using an anisotropic metasurface with two principal polarization axes, one of which possesses a Fano-type resonance. A gate-controlled single-layer graphene integrated with the metasurface was employed as an electro-optic element controlling the phase and intensity of light polarized along the resonant axis of the GIAM. When the incident light is polarized at an angle to the resonant axis of the metasurface, the ellipticity of the reflected light can be dynamically controlled by the application of a gate voltage. Thus accomplished dynamic polarization control is experimentally demonstrated and characterized by measuring the Stokes polarization parameters. Large changes of the ellipticity and the tilt angle of the polarization ellipse are observed. Our measurements show that the tilt angle can be changed from positive values through zero to negative values while keeping the ellipticity constant, potentially paving the way to rapid ellipsometry and other characterization techniques requiring fast polarization shifting. This article is part of the themed issue ‘New horizons for nanophotonics’.

scholarly journals Time-Of-Flight ERDA for Depth Profiling of Light Elements

2020 ◽  
Vol 4 (4) ◽  
pp. 40
Author(s):  
Keisuke Yasuda
Keyword(s):  
Ion Beam ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Semiconductor Detectors ◽  
Light Elements ◽  
Elastic Recoil ◽  
Measurement Sensitivity ◽  
Elastic Recoil Detection ◽  
Detection Analysis

The time-of-flight elastic recoil detection analysis (TOF-ERDA) method is one of the ion beam analysis methods that is capable of analyzing light elements in a sample with excellent depth resolution. In this method, simultaneous measurements of recoil ion energy and time of flight are performed, and ion mass is evaluated. The energy of recoil ions is calculated from TOF, which gives better energy resolution than conventional Silicon semiconductor detectors (SSDs). TOF-ERDA is expected to be particularly applicable for the analysis of light elements in thin films. In this review, the principle of TOF-ERDA measurement and details of the measurement equipment along with the performance of the instrumentation, including depth resolution and measurement sensitivity, are described. Examples of TOF-ERDA analysis are presented with a focus on the results obtained from the measurement system developed by the author.

Spectroscopic ellipsometric investigation of optical parameters of oil-water thin multiple systems

2020 ◽  
Vol 34 (08) ◽  
pp. 2050058
Author(s):  
Kh. N. Ahmadova
Keyword(s):  
Crude Oil ◽  
Dielectric Function ◽  
Polarization State ◽  
Optical Parameters ◽  
Multiple Systems ◽  
Surfaces And Interfaces ◽  
Reflected Light ◽  
Ultrathin Layers ◽  
Highly Sensitive ◽  
Oil Water

To determine the optical parameters of crude oil and seawater systems, we carried out spectral investigations using the ellipsometry method, which is a highly sensitive and accurate optical method for studying the surfaces and interfaces of various media. This method is based on studying the change in the polarization state of reflected light after its interaction with the surface of interfaces of these media. Crude oil and seawater from different regions of Caspian Sea were accessed by spectroscopic ellipsometry over the 200–1700 nm spectral range at room-temperature. Optical constants and dielectric function were obtained for massive samples of each substance, as well as for ultrathin layers of the oil spilled over the sea surface. Dielectric function, when completely determined in the frequency regions corresponding to electronic transitions and excitation of atomic or molecular vibrations in the object, is a unique dielectric fingerprint of this object. Oils with even miserable difference in type and concentration of biomarkers and heterocomponents will have different dielectric functions. The possibility to use dielectric function as a unique optical fingerprint for oil identification is figured out.

Depth resolution enhancement using light-field light-sheet fluorescence microscopy

2021 ◽  
Author(s):  
Xiaoting Peng ◽  
Dong Liang ◽  
Shanshan Zheng ◽  
Yuyao Hu ◽  
Jun Liu ◽  
...  
Keyword(s):  
Fluorescence Microscopy ◽  
Light Field ◽  
Resolution Enhancement ◽  
Depth Resolution ◽  
Light Sheet ◽  
Light Sheet Fluorescence Microscopy

A Depth Resolution Enhancement Technique in Fourier Domain Optical Coherence Tomography

2015 ◽  
Vol 35 (3) ◽  
pp. 0311002
Author(s):  
郭昕 Guo Xin ◽  
王向朝 Wang Xiangzhao ◽  
南楠 Nan Nan ◽  
李中梁 Li Zhongliang
Keyword(s):  
Optical Coherence Tomography ◽  
Resolution Enhancement ◽  
Depth Resolution ◽  
Fourier Domain ◽  
Optical Coherence ◽  
Enhancement Technique ◽  
Resolution Enhancement Technique
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