Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques

2009 ◽  
Vol 58 (7) ◽  
pp. 2145-2158 ◽  
Author(s):  
Chenglin Yang ◽  
Shulin Tian ◽  
Bing Long
Keyword(s):  
Test Point ◽  
Graph Search ◽  
Point Selection ◽  
Fault Dictionary ◽  
Test Point Selection ◽  
Selection For

Optimum Test Point Selection Based on MADM for Analog Fault Dictionary Techniques

2011 ◽  
Vol 48-49 ◽  
pp. 807-812
Author(s):  
Xiao Mei Chen ◽  
Xiao Feng Meng ◽  
Guo Hua Wang
Keyword(s):  
Large Scale ◽  
Search Algorithm ◽  
Test Point ◽  
Graph Search ◽  
Maximum Deviation ◽  
A Algorithm ◽  
Point Selection ◽  
Fault Dictionary ◽  
Test Point Selection ◽  
Multi Attribute Decision Making

a new graph-search algorithm based on multi-attribute decision making (MADM) is proposed. Firstly, A* algorithm is used for graph-search, but when cost functions of two nodes are equal, three attributes describing a node are introduced. Secondly, a multi-attribute decision based on maximum deviation principle is used for nodes evaluation in order to select the best node for expanding. The proposed algorithm could overcome deviation brought by node evaluation based on information theory metrics only, which results in high accuracy. The outcome of simulation verification at the end of this paper manifests that this algorithm has excellent accuracy as the exhaustive algorithm, and is more quickly for large scale computation.

A Novel Test Point Selection Method for Analog Fault Dictionary Techniques

2010 ◽  
Vol 26 (5) ◽  
pp. 523-534 ◽  
Author(s):  
ChengLin Yang ◽  
ShuLin Tian ◽  
Bing Long ◽  
Fang Chen
Keyword(s):  
Selection Method ◽  
Test Point ◽  
Point Selection ◽  
Fault Dictionary ◽  
Test Point Selection
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