Test point selection for analog fault diagnosis of unpowered circuit boards

J.-L. Huang; K.-T. Cheng

doi:10.1109/82.877140

Test point selection for analog fault diagnosis of unpowered circuit boards

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ◽

10.1109/82.877140 ◽

2000 ◽

Vol 47 (10) ◽

pp. 977-987 ◽

Cited By ~ 12

Author(s):

J.-L. Huang ◽

K.-T. Cheng

Keyword(s):

Fault Diagnosis ◽

Test Point ◽

Circuit Boards ◽

Point Selection ◽

Analog Fault Diagnosis ◽

Test Point Selection ◽

Selection For

Download Full-text

Automatic test point selection for linear analog network fault diagnosis

10.1109/iscas.1990.111904 ◽

2002 ◽

Cited By ~ 10

Author(s):

S. Manetti ◽

M.C. Piccirilli ◽

A. Liberatore

Keyword(s):

Fault Diagnosis ◽

Test Point ◽

Automatic Test ◽

Point Selection ◽

Linear Analog ◽

Test Point Selection ◽

Selection For ◽

Network Fault

Download Full-text

Test point selection methods for the self-testing based analogue fault diagnosis system

IEE Proceedings G (Electronic Circuits and Systems) ◽

10.1049/ip-g-1.1985.0037 ◽

1985 ◽

Vol 132 (5) ◽

pp. 173

Author(s):

C.C. Wu

Keyword(s):

Fault Diagnosis ◽

Test Point ◽

The Self ◽

Selection Methods ◽

Point Selection ◽

Diagnosis System ◽

Self Testing ◽

Test Point Selection ◽

Fault Diagnosis System

Download Full-text

Optimal Test Point Selection for Sequential Manufacturing Processes

Bell System Technical Journal ◽

10.1002/j.1538-7305.1972.tb01914.x ◽

1972 ◽

Vol 51 (1) ◽

pp. 291-300 ◽

Cited By ~ 13

Author(s):

M. R. Garey

Keyword(s):

Test Point ◽

Manufacturing Processes ◽

Point Selection ◽

Optimal Test ◽

Test Point Selection ◽

Selection For

Download Full-text

Automated test generation and test point selection for specification test of analog circuits

International Symposium on Signals Circuits and Systems Proceedings SCS 2003 (Cat No 03EX720) ISQED-04 ◽

10.1109/isqed.2004.1283707 ◽

2004 ◽

Cited By ~ 7

Author(s):

A. Halder ◽

A. Chatterjee

Keyword(s):

Analog Circuits ◽

Test Generation ◽

Test Point ◽

Specification Test ◽

Point Selection ◽

Automated Test Generation ◽

Test Point Selection ◽

Automated Test ◽

Selection For

Download Full-text

Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2010.2050356 ◽

2011 ◽

Vol 60 (1) ◽

pp. 176-185 ◽

Cited By ~ 47

Author(s):

Chenglin Yang ◽

Shulin Tian ◽

Bing Long ◽

Fang Chen

Keyword(s):

Fault Diagnosis ◽

Analog Circuit ◽

Test Point ◽

Selection Problem ◽

Point Selection ◽

Test Point Selection ◽

Circuit Fault Diagnosis

Download Full-text

A hybrid algorithm for test point selection for scan-based BIST

Proceedings of the 34th annual conference on Design automation conference - DAC '97 ◽

10.1145/266021.266205 ◽

1997 ◽

Cited By ~ 16

Author(s):

Huan-Chih Tsai ◽

Chih-Jen Lin ◽

Sudipta Bhawmik ◽

Kwang-Ting Cheng

Keyword(s):

Hybrid Algorithm ◽

Test Point ◽

Point Selection ◽

Test Point Selection ◽

Selection For

Download Full-text

Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2008.2006725 ◽

2009 ◽

Vol 58 (7) ◽

pp. 2145-2158 ◽

Cited By ~ 49

Author(s):

Chenglin Yang ◽

Shulin Tian ◽

Bing Long

Keyword(s):

Test Point ◽

Graph Search ◽

Point Selection ◽

Fault Dictionary ◽

Test Point Selection ◽

Selection For

Download Full-text

A multi-attribute decision based optimum test point selection for analog fault dictionary techniques

2010 IEEE International Conference on Mechatronics and Automation ◽

10.1109/icma.2010.5589009 ◽

2010 ◽

Author(s):

Xiaomei Chen ◽

Xiaofeng Meng ◽

Guohua Wang

Keyword(s):

Test Point ◽

Point Selection ◽

Fault Dictionary ◽

Test Point Selection ◽

Selection For

Download Full-text

Iterative test-point selection for analog circuits

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510837 ◽

2002 ◽

Cited By ~ 18

Author(s):

J. van Spaandonk ◽

T.A.M. Kevenaar

Keyword(s):

Analog Circuits ◽

Test Point ◽

Point Selection ◽

Test Point Selection ◽

Selection For

Download Full-text

Layout Analysis And Automatic Test Point Selection For Fast Prototype Debug Using E-beam Or Laser-beam Testsystems

Proceedings of the IEEE Custom Integrated Circuits Conference ◽

10.1109/cicc.1992.591326 ◽

2005 ◽

Cited By ~ 3

Author(s):

R. Scharf ◽

C. Kuntzsch ◽

K. Helmreich ◽

W. Wolz ◽

K.D. MuIler-GIaser

Keyword(s):

Laser Beam ◽

Test Point ◽

Automatic Test ◽

Layout Analysis ◽

Point Selection ◽

Test Point Selection ◽

Selection For

Download Full-text