Using Data Compression in Automatic Test Equipment for System-on-Chip Testing

F. Karimi; Z. Navabi; W.M. Meleis; F. Lombardi

doi:10.1109/tim.2003.822703

Using Data Compression in Automatic Test Equipment for System-on-Chip Testing

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2003.822703 ◽

2004 ◽

Vol 53 (2) ◽

pp. 308-317 ◽

Cited By ~ 9

Author(s):

F. Karimi ◽

Z. Navabi ◽

W.M. Meleis ◽

F. Lombardi

Keyword(s):

Data Compression ◽

System On Chip ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test ◽

Chip Testing ◽

Using Data ◽

On Chip

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Data compression for system-on-chip testing using ATE

17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. ◽

10.1109/dftvs.2002.1173513 ◽

2003 ◽

Cited By ~ 3

Author(s):

F. Karimi ◽

W. Meleis ◽

Z. Navabi ◽

F. Lombardi

Keyword(s):

Data Compression ◽

System On Chip ◽

Chip Testing ◽

On Chip

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Logical planning for automatic test equipment software requirements

10.2514/6.1977-1429 ◽

1977 ◽

Author(s):

J. FERRELL

Keyword(s):

Test Equipment ◽

Software Requirements ◽

Automatic Test Equipment ◽

Automatic Test

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IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML

10.3403/30257785 ◽

2012 ◽

Keyword(s):

Test Equipment ◽

Markup Language ◽

Automatic Test Equipment ◽

Automatic Test ◽

Test Information ◽

Ieee Standard

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Economic model of calibration improvements for automatic test equipment

10.6028/nbs.sp.673 ◽

1984 ◽

Author(s):

Stephen F Weber ◽

Anne P Hillstrom

Keyword(s):

Economic Model ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test

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Automatic Test Equipment in the Production Process

IEEE Transactions on Manufacturing Technology ◽

10.1109/tmft.1975.1135861 ◽

1975 ◽

Vol 4 (2) ◽

pp. 48-52 ◽

Cited By ~ 2

Author(s):

A. Boudreault

Keyword(s):

Production Process ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test

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CFD analysis of automatic test equipment

ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258) ◽

10.1109/itherm.2002.1012511 ◽

2003 ◽

Author(s):

V.R. Gaurav ◽

G. Laird

Keyword(s):

Test Equipment ◽

Cfd Analysis ◽

Automatic Test Equipment ◽

Automatic Test

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Trade-Off Considerations in Using Automatic Test Equipment

IRE Transactions on Production Techniques ◽

10.1109/tpep.1961.1136105 ◽

1961 ◽

Vol 5 (1) ◽

pp. 39-44 ◽

Cited By ~ 1

Author(s):

E. Roel

Keyword(s):

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test ◽

Trade Off

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IEEE Standard for Artificial Intelligence and Expert System Tie to Automatic Test Equipment (AI-ESTATE): Overview and Architecture

10.1109/ieeestd.1996.80816 ◽

1995 ◽

Keyword(s):

Artificial Intelligence ◽

Expert System ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test ◽

Ieee Standard

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3.5Gsps MIPI C-PHY Receiver Circuit for Automatic Test Equipment

10.1109/itc50571.2021.00040 ◽

2021 ◽

Author(s):

Seongkwan Lee ◽

Minho Kang ◽

Cheolmin Park ◽

HyungSun Ryu ◽

Jaemoo Choi ◽

...

Keyword(s):

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test

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Automatic Test Equipment (ATE) and Production Test

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_11 ◽

2005 ◽

pp. 257-266

Keyword(s):

Test Equipment ◽

Production Test ◽

Automatic Test Equipment ◽

Automatic Test

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