Subband Filtering for Time and Frequency Analysis of Mixed-Signal Circuit Testing

J. Roh; J.A. Abraham

doi:10.1109/tim.2003.820494

Subband Filtering for Time and Frequency Analysis of Mixed-Signal Circuit Testing

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2003.820494 ◽

2004 ◽

Vol 53 (2) ◽

pp. 602-611 ◽

Cited By ~ 18

Author(s):

J. Roh ◽

J.A. Abraham

Keyword(s):

Frequency Analysis ◽

Circuit Testing ◽

Mixed Signal

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A configurable built in current sensor for mixed signal circuit testing

9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. ◽

10.1109/olt.2003.1214392 ◽

2004 ◽

Cited By ~ 2

Author(s):

R. Picos ◽

J. Font ◽

E. Isern ◽

M. Roca ◽

E. Garcia

Keyword(s):

Current Sensor ◽

Circuit Testing ◽

Mixed Signal

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Wavelet analysis of current measurements for mixed-signal circuit testing

Proceedings of 2010 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.2010.5537999 ◽

2010 ◽

Cited By ~ 1

Author(s):

M. G. Dimopoulos ◽

D. K. Papakostas ◽

B. D. Vassios ◽

A. A. Hatzopoulos

Keyword(s):

Wavelet Analysis ◽

Circuit Testing ◽

Mixed Signal

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Analog/Mixed-Signal Circuit Testing Technologies in IoT Era

2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict49897.2020.9278194 ◽

2020 ◽

Author(s):

Haruo Kobayashi ◽

Anna Kuwana ◽

Jianglin Wei ◽

Yujie Zhao ◽

Shogo Katayama ◽

...

Keyword(s):

Circuit Testing ◽

Mixed Signal

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Application of joint time-frequency analysis in mixed signal testing

Proceedings., International Test Conference ◽

10.1109/test.1994.528021 ◽

2002 ◽

Cited By ~ 11

Author(s):

F. Bouwman ◽

T. Zwemstra ◽

S. Hartanato ◽

K. Baker ◽

J. Koopmans

Keyword(s):

Frequency Analysis ◽

Time Frequency Analysis ◽

Mixed Signal ◽

Time Frequency ◽

Mixed Signal Testing

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A tutorial introduction to research on analog and mixed-signal circuit testing

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ◽

10.1109/82.728852 ◽

1998 ◽

Vol 45 (10) ◽

pp. 1389-1407 ◽

Cited By ~ 165

Author(s):

L.S. Milor

Keyword(s):

Circuit Testing ◽

Mixed Signal

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Mixed-Signal Circuit Testing Using Wavelet Signatures

Mixed-Signal Circuits ◽

10.1201/b19378-9 ◽

2018 ◽

pp. 142-161

Author(s):

Michael G. Dimopoulos

Keyword(s):

Circuit Testing ◽

Mixed Signal

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Implementation of Low-Cost Reconfigurable External Mixed-Signal VLSI Circuit Testing System

Australian Journal of Electrical & Electronics Engineering ◽

10.1080/1448837x.2010.11464259 ◽

2010 ◽

Vol 7 (1) ◽

pp. 73-82

Author(s):

S.Z. Islam ◽

M.A.M. Ali

Keyword(s):

Low Cost ◽

Testing System ◽

Vlsi Circuit ◽

Circuit Testing ◽

Mixed Signal

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Mixed-signal circuit testing-A review

Proceedings of Third International Conference on Electronics, Circuits, and Systems ◽

10.1109/icecs.1996.584604 ◽

2002 ◽

Author(s):

Chin-Long Wey

Keyword(s):

Circuit Testing ◽

Mixed Signal

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A case study of mixed-signal integrated circuit testing: an application of current testing using the upper limit and the lower limit

Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94 ◽

10.1109/iscas.1994.409304 ◽

2002 ◽

Cited By ~ 8

Author(s):

Y. Miura ◽

S. Naito ◽

K. Kinoshita

Keyword(s):

Lower Limit ◽

Integrated Circuit ◽

Circuit Testing ◽

Mixed Signal ◽

Current Testing ◽

Integrated Circuit Testing ◽

Upper Limit

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Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097100 ◽

2017 ◽

Cited By ~ 2

Author(s):

Masayuki Kawabata ◽

Koji Asami ◽

Shohei Shibuya ◽

Tomonori Yanagida ◽

Haruo Kobayashi

Keyword(s):

Signal Generation ◽

Circuit Testing ◽

Mixed Signal ◽

Low Distortion ◽

Digital Ate

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