Low-distortion signal generation for ADC testing

2014 ◽  
Author(s):  
Fumitaka Abe ◽  
Yutaro Kobayashi ◽  
Kenji Sawada ◽  
Keisuke Kato ◽  
Osamu Kobayashi ◽  
...  
Keyword(s):  
Signal Generation ◽  
Low Distortion ◽  
Adc Testing

Two-Tone Signal Generation for Communication Application ADC Testing

2012 ◽  
Author(s):  
Keisuke Kato ◽  
Fumitaka Abe ◽  
Kazuyuki Wakabayashi ◽  
Chuan Gao ◽  
Takafumi Yamada ◽  
...  
Keyword(s):  
Signal Generation ◽  
Tone Signal ◽  
Adc Testing

Two-Tone Signal Generation for ADC Testing

2013 ◽  
Vol E96.C (6) ◽  
pp. 850-858 ◽  
Author(s):  
Keisuke KATO ◽  
Fumitaka ABE ◽  
Kazuyuki WAKABAYASHI ◽  
Chuan GAO ◽  
Takafumi YAMADA ◽  
...  
Keyword(s):  
Signal Generation ◽  
Tone Signal ◽  
Adc Testing

Low-Distortion One-Tone and Two-Tone Signal Generation Using AWG Over Full Nyquist Region

2018 ◽  
Author(s):  
Tomonori Yanagida ◽  
Shohei Shibuya ◽  
Kosuke Machida ◽  
Koji Asami ◽  
Haruo Kobayashi
Keyword(s):  
Signal Generation ◽  
Tone Signal ◽  
Low Distortion

High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform Generator

2019 ◽  
Vol 888 ◽  
pp. 52-58
Author(s):  
Shohei Shibuya ◽  
Tomonori Yanagida ◽  
Koji Asami ◽  
Haruo Kobayashi
Keyword(s):  
High Frequency ◽  
Signal Generation ◽  
Waveform Generator ◽  
Arbitrary Waveform Generator ◽  
Analog Filter ◽  
Frequency Signal ◽  
High Frequency Signal ◽  
Low Distortion ◽  
Ic Testing ◽  
Arbitrary Waveform

This paper describes analysis, simulation and experiment verification of high-frequency one-tone and two-tone low-distortion signal generation methods with an arbitrary waveform generator (AWG) for analog/mixed-signal IC testing. Our previously proposed phase switching method was limited to low-frequency signal generation, and it cannot be used directly for high-frequency signal generation. We propose here a method for generating a low-distortion high-frequency signal (i.e., the frequency close to the Nyquist frequency of the AWG) with an AWG, and show its theoretical analysis and simulation results. With this proposed method, 3rd order harmonics of the generated signal are suppressed simply by changing the AWG program (or waveform memory contents)—AWG nonlinearity identification is not required—and spurious components, generated far from the signal band, are relatively easy to remove using an analog filter.

Low-IMD Two-Tone Signal Generation for ADC Testing

2012 ◽  
Author(s):  
Keisuke Kato ◽  
Fumitaka Abe ◽  
Kazuyuki Wakabayashi ◽  
Takafumi Yamada ◽  
Haruo Kobayashi ◽  
...  
Keyword(s):  
Signal Generation ◽  
Tone Signal ◽  
Adc Testing
Sign in / Sign up

Export Citation Format

Share Document