Fault modeling and diagnosis for nanometric analog circuits

2013 ◽  
Author(s):  
Ke Huang ◽  
Haralampos-G. Stratigopoulosy ◽  
Salvador Miry
Keyword(s):  
Analog Circuits ◽  
Fault Modeling

Circle Equation-Based Fault Modeling Method for Linear Analog Circuits

2014 ◽  
Vol 63 (9) ◽  
pp. 2145-2159 ◽  
Author(s):  
Shulin Tian ◽  
ChengLin Yang ◽  
Fang Chen ◽  
Zhen Liu
Keyword(s):  
Analog Circuits ◽  
Fault Modeling ◽  
Modeling Method ◽  
Linear Analog

Hierarchical fault modeling for linear analog circuits

1996 ◽  
Vol 10 (1-2) ◽  
pp. 89-99 ◽  
Author(s):  
Naveena Nagi ◽  
Jacob A. Abraham
Keyword(s):  
Analog Circuits ◽  
Fault Modeling ◽  
Linear Analog

Research on Test Points Selection Using Complex Field Fault Modeling in Analog Circuit

2013 ◽  
Vol 444-445 ◽  
pp. 1158-1162
Author(s):  
Jing Yang ◽  
Cheng Lin Yang ◽  
Zhen Liu
Keyword(s):  
Analog Circuits ◽  
Global Minimum ◽  
Analog Circuit ◽  
Search Algorithm ◽  
Fault Modeling ◽  
Fault Model ◽  
Complex Field ◽  
Dependency Matrix ◽  
Test Points ◽  
Test Points Selection

In this paper, a new test nodes selection technique based on the complex field fault modeling of analog circuits testability is presented. The function F () by the complex field fault modeling can be used as the fault model, which is applicable to both hard (open or short) and soft (parametric) faults. Therefore, we can obtain the signature curves of the potential fault components by PSPICE and MATLAB. For the testability of fault model, fault-test dependency matrix can be concluded. With the integer-coded fault-wise table method and heuristic graph search algorithm, we can obtain a global minimum node set. The number of potential faults with complex field fault modeling is half compared with the traditional methods and the time complexity of the circuit can be reduced significantly.

Methods of Handling the Aliasing and Tolerance Problem for a New Unified Fault Modeling Technique in Analog-Circuit Fault Diagnosis

2014 ◽  
Vol 981 ◽  
pp. 11-16 ◽  
Author(s):  
Yuan Gao ◽  
Cheng Lin Yang ◽  
Shu Lin Tian
Keyword(s):  
Fault Diagnosis ◽  
Analog Circuits ◽  
Analog Circuit ◽  
Fault Modeling ◽  
Modeling Method ◽  
Soft Fault ◽  
The Difference ◽  
Circuit Fault Diagnosis ◽  
Nonlinear Analog Circuits ◽  
Nonlinear Analog

Soft fault diagnosis and tolerance are two challenging problems in analog circuit fault diagnosis. This paper proposes approaches to solve these two problems. First, a complex field modeling method and its theoretical proof are presented. This fault modeling method is applicable to both hard (open or short) and soft (parametric) faults. It is also applicable to either linear or nonlinear analog circuits. Then, the parameter tolerance is taken into consideration. A frequency selection method is proposed to maximize the difference between the faults fault signature. Hence, the aliasing problem arise from tolerance can be mitigated. The effectiveness of the proposed approaches is verified by simulated results.

Fault Modeling on Complex Plane and Tolerance Handling Methods for Analog Circuits

2013 ◽  
Vol 62 (10) ◽  
pp. 2730-2738 ◽  
Author(s):  
Chenglin Yang ◽  
Shulin Tian ◽  
Zhen Liu ◽  
Jianguo Huang ◽  
Fang Chen
Keyword(s):  
Complex Plane ◽  
Analog Circuits ◽  
Fault Modeling ◽  
Handling Methods
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