Fault modeling on complex field using least-square circle fitting for linear analog circuits

2017 ◽  
Vol 12 (5) ◽  
pp. 638-645
Author(s):  
Jian Xiong ◽  
Shulin Tian ◽  
Chenglin Yang
Keyword(s):  
Analog Circuits ◽  
Fault Modeling ◽  
Least Square ◽  
Complex Field ◽  
Circle Fitting ◽  
Linear Analog

Circle Equation-Based Fault Modeling Method for Linear Analog Circuits

2014 ◽  
Vol 63 (9) ◽  
pp. 2145-2159 ◽  
Author(s):  
Shulin Tian ◽  
ChengLin Yang ◽  
Fang Chen ◽  
Zhen Liu
Keyword(s):  
Analog Circuits ◽  
Fault Modeling ◽  
Modeling Method ◽  
Linear Analog

Hierarchical fault modeling for linear analog circuits

1996 ◽  
Vol 10 (1-2) ◽  
pp. 89-99 ◽  
Author(s):  
Naveena Nagi ◽  
Jacob A. Abraham
Keyword(s):  
Analog Circuits ◽  
Fault Modeling ◽  
Linear Analog

Research on Test Points Selection Using Complex Field Fault Modeling in Analog Circuit

2013 ◽  
Vol 444-445 ◽  
pp. 1158-1162
Author(s):  
Jing Yang ◽  
Cheng Lin Yang ◽  
Zhen Liu
Keyword(s):  
Analog Circuits ◽  
Global Minimum ◽  
Analog Circuit ◽  
Search Algorithm ◽  
Fault Modeling ◽  
Fault Model ◽  
Complex Field ◽  
Dependency Matrix ◽  
Test Points ◽  
Test Points Selection

In this paper, a new test nodes selection technique based on the complex field fault modeling of analog circuits testability is presented. The function F () by the complex field fault modeling can be used as the fault model, which is applicable to both hard (open or short) and soft (parametric) faults. Therefore, we can obtain the signature curves of the potential fault components by PSPICE and MATLAB. For the testability of fault model, fault-test dependency matrix can be concluded. With the integer-coded fault-wise table method and heuristic graph search algorithm, we can obtain a global minimum node set. The number of potential faults with complex field fault modeling is half compared with the traditional methods and the time complexity of the circuit can be reduced significantly.

Phasor Analysis Based Fault Modeling and Fault Diagnosis Methods for Linear Analog Circuits

2014 ◽  
Vol 981 ◽  
pp. 3-10 ◽  
Author(s):  
Yuan Gao ◽  
Cheng Lin Yang ◽  
Shu Lin Tian
Keyword(s):  
Fault Diagnosis ◽  
Data Base ◽  
Analog Circuit ◽  
Feature Selection Method ◽  
Fault Modeling ◽  
Modeling Method ◽  
Support Vector ◽  
Linear Analog ◽  
Circuit Fault Diagnosis ◽  
Phasor Analysis

Soft fault diagnosis and tolerance are two challenging problems in linear analog circuit fault diagnosis. To solve these problems, a phasor analysis based fault modeling method and its theoretical proof are presented at first. Second, to form fault feature data base, the differential voltage phasor ratio (DVPR) is decomposed into real and imaginary parts. Optimal feature selection method and testability analysis method are used to determine the optimal fault feature data base. Statistical experiments prove that the proposed fault modeling method can improve the fault diagnosis robustness. Then, Multi-class support vector machine (SVM) classifiers are used for fault diagnosis. The effectiveness of the proposed approaches is verified by both simulated and experimental results.

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