A high accuracy high throughput jitter test solution on ATE for 3GBPS and 6gbps serial-ata
2012 ◽
Vol 40
(2)
◽
pp. 131-139
◽
2020 ◽
1986 ◽
Vol 109
◽
pp. 321-330
2009 ◽
Vol 106
(16)
◽
pp. 6712-6717
◽
2020 ◽
Keyword(s):
Keyword(s):