Abstract
The use of memory arrays to drive yield enhancement has driven the development of many technologies. The uniformity of the arrays allows for easy testing and defect location. Unfortunately, the complexities of the logic circuitry are not represented well in the memory arrays. As technologies push to smaller geometries and the layout and timing of the logic circuitry become more problematic the ability to address yield issue is becoming critical. This paper presents the added yield enhancement capabilities of using e600 core Scan Chain and Scan Pattern testing for logic debug, ways to interpret the fail data, and test methodologies to balance test time and acquiring data. Selecting a specific test methodology and using today's advanced tools like Freescale's DFT/FA has been proven to find more yield issues, earlier, enabling quicker issue resolution.
The processor FT_MX is a high-performance chip independently developed by the National University of Defense Technology, with an innovative architecture and instruction set. LLVM architecture is a widely used and efficient open source compiler framework initiated by the University of Illinois. This paper introduces the basic architecture and functions of LLVM, analyzes the back-end migration mechanism of the architecture in detail, and gives the specific process of implementing FT_MX back-end migration, and realizes the support of LLVM architecture to the back-end of FT_MX processor.
Back-end porting of FT_MX based on LLVM compilation architecture