Crosstalk test generation on pseudo industrial circuits: a case study

Proceedings International Test Conference 2001 (Cat. No.01CH37260) ◽

10.1109/test.2001.966673 ◽

2002 ◽

Cited By ~ 6

Author(s):

Liang-Chi Chen ◽

T.M. Mak ◽

M.A. Breuer ◽

S.K. Gupta

Keyword(s):

Test Generation ◽

Industrial Circuits

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Complete search in test generation for industrial circuits with improved bus-conflict detection

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741616 ◽

2002 ◽

Cited By ~ 2

Author(s):

J.Th. van der Linden ◽

M.H. Konijnenburg ◽

A.J. van de Goor

Keyword(s):

Test Generation ◽

Conflict Detection ◽

Complete Search ◽

Industrial Circuits

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Automatic test generation for the analysis of a real-time system: Case study

Proceedings Third IEEE Real-Time Technology and Applications Symposium ◽

10.1109/rttas.1997.601349 ◽

2002 ◽

Cited By ~ 14

Author(s):

D. Clarke ◽

I. Lee

Keyword(s):

Real Time ◽

Test Generation ◽

Automatic Test Generation ◽

Automatic Test ◽

Time System ◽

Real Time System

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Trajectory Optimization for Falsification:A Case Study of Vehicle Rollover Test Generation Based on Black-box Models

IFAC-PapersOnLine ◽

10.1016/j.ifacol.2020.12.1175 ◽

2020 ◽

Vol 53 (2) ◽

pp. 14279-14284

Author(s):

Sunbochen Tang ◽

Nan Li ◽

Ilya Kolmanovsky ◽

Anouck Girard

Keyword(s):

Test Generation ◽

Trajectory Optimization ◽

Black Box ◽

Box Models ◽

Vehicle Rollover ◽

Black Box Models

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Test generation for time critical systems: Tool and case study

Proceedings 13th Euromicro Conference on Real-Time Systems ◽

10.1109/emrts.2001.934021 ◽

2002 ◽

Cited By ~ 5

Author(s):

B. Nielsen ◽

A. Skou

Keyword(s):

Test Generation ◽

Critical Systems ◽

Time Critical

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Case Study: Efficient SDD test generation for very large integrated circuits

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783759 ◽

2011 ◽

Cited By ~ 5

Author(s):

Ke Peng ◽

Fang Bao ◽

Geoff Shofner ◽

LeRoy Winemberg ◽

Mohammad Tehranipoor

Keyword(s):

Integrated Circuits ◽

Test Generation

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Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study

Seventh International Workshop on Microprocessor Test and Verification (MTV'06) ◽

10.1109/mtv.2006.10 ◽

2006 ◽

Cited By ~ 7

Author(s):

Heon-Mo Koo ◽

Prabhat Mishra ◽

Jayanta Bhadra ◽

Magdy Abadir

Keyword(s):

Test Generation

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Towards interoperability test generation of time dependent protocols: a case study

IEEE Global Telecommunications Conference, 2004. GLOBECOM '04. ◽

10.1109/glocom.2004.1378031 ◽

2005 ◽

Cited By ~ 2

Author(s):

Zhiliang Wang ◽

Jianping Wu ◽

Xia Yin

Keyword(s):

Test Generation ◽

Time Dependent ◽

Interoperability Test

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Reification of Executable Test Scripts in Formal Specification-Based Test Generation: The Java Card Transaction Mechanism Case Study

FME 2003: Formal Methods - Lecture Notes in Computer Science ◽

10.1007/978-3-540-45236-2_42 ◽

2003 ◽

pp. 778-795 ◽

Cited By ~ 8

Author(s):

Fabrice Bouquet ◽

Bruno Legeard

Keyword(s):

Test Generation ◽

Formal Specification ◽

Java Card

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The Feasibility of Automated Feedback-Directed Specification-Based Test Generation: A Case Study of a High-Assurance Operating System

10.1109/issre.2008.33 ◽

2008 ◽

Cited By ~ 2

Author(s):

Sam Weber ◽

Amitkumar Paradkar ◽

Suzanne K. McIntosh ◽

David C. Toll ◽

Paul A. Karger ◽

...

Keyword(s):

Operating System ◽

Test Generation ◽

High Assurance ◽

Automated Feedback

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Application of Two Test Generation Tools to an Industrial Case Study

Lecture Notes in Computer Science - Testing of Communicating Systems ◽

10.1007/11754008_9 ◽

2006 ◽

pp. 134-148 ◽

Cited By ~ 4

Author(s):

Ana Cavalli ◽

Stéphane Maag ◽

Wissam Mallouli ◽

Mikael Marche ◽

Yves-Marie Quemener

Keyword(s):

Test Generation ◽

Industrial Case Study

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