Native mode functional test generation for processors with applications to self test and design validation

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743296 ◽

2002 ◽

Cited By ~ 34

Author(s):

Jian Shen ◽

J.A. Abraham

Keyword(s):

Test Generation ◽

Functional Test ◽

Design Validation ◽

Self Test

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ISA Based Functional Test Generation with Application to Self-Test of RISC Processors

2006 IEEE Design and Diagnostics of Electronic Circuits and systems ◽

10.1109/ddecs.2006.1649575 ◽

2006 ◽

Cited By ~ 4

Author(s):

V.V. Belkin ◽

S.G. Sharshunov

Keyword(s):

Test Generation ◽

Functional Test ◽

Self Test

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Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling

Journal of Electronic Testing ◽

10.1007/bf00135230 ◽

1991 ◽

Vol 2 (4) ◽

pp. 351-372 ◽

Cited By ~ 37

Author(s):

Abhijit Chatterjee ◽

Jacob A. Abraham

Keyword(s):

Test Generation ◽

Design For Testability ◽

Graph Labeling ◽

Self Test ◽

Arithmetic Units ◽

Built In Self Test

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Functional test generation for FSMs by fault extraction

32nd Design Automation Conference ◽

10.1145/196244.196622 ◽

1994 ◽

Cited By ~ 1

Author(s):

Bapiraju Vinnakota ◽

Jason Andrews

Keyword(s):

Test Generation ◽

Functional Test

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FUNTASSI: A functional test generation assistant

Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93 ◽

10.1109/cicc.1993.590780 ◽

2002 ◽

Author(s):

K. Kohno ◽

M. Sekine

Keyword(s):

Test Generation ◽

Functional Test

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A functional test generation technique for RTL datapaths

2012 IEEE International High Level Design Validation and Test Workshop (HLDVT) ◽

10.1109/hldvt.2012.6418244 ◽

2012 ◽

Cited By ~ 1

Author(s):

Bijan Alizadeh ◽

Masahiro Fujita

Keyword(s):

Test Generation ◽

Functional Test ◽

Generation Technique

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Automated Functional Test Generation for Digital Systems Through a Compact Binary Differential Evolution Algorithm

Journal of Electronic Testing ◽

10.1007/s10836-015-5540-6 ◽

2015 ◽

Vol 31 (4) ◽

pp. 361-380 ◽

Cited By ~ 5

Author(s):

Alfonso Martinez Cruz ◽

Ricardo Barrón Fernández ◽

Herón Molina Lozano ◽

Marco Antonio Ramírez Salinas ◽

Luis Alfonso Villa Vargas

Keyword(s):

Differential Evolution ◽

Test Generation ◽

Differential Evolution Algorithm ◽

Digital Systems ◽

Functional Test ◽

Compact Binary ◽

Evolution Algorithm ◽

Binary Differential Evolution

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Functional Test Generation For finite State Machines With Concurrent Fault Simulation

10.1109/atw.1994.747832 ◽

2005 ◽

Author(s):

N.L. Cooray ◽

E.W. Czeck

Keyword(s):

Test Generation ◽

Fault Simulation ◽

Finite State Machines ◽

Functional Test ◽

State Machines ◽

Finite State ◽

Concurrent Fault Simulation

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Decision ordering based property decomposition for functional test generation

2011 Design, Automation & Test in Europe ◽

10.1109/date.2011.5763037 ◽

2011 ◽

Author(s):

Mingsong Chen ◽

P Mishra

Keyword(s):

Test Generation ◽

Functional Test ◽

Property Decomposition

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Functional test generation from UI test scenarios using reinforcement learning for android applications

Software Testing Verification and Reliability ◽

10.1002/stvr.1752 ◽

2020 ◽

Author(s):

Yavuz Koroglu ◽

Alper Sen

Keyword(s):

Reinforcement Learning ◽

Test Generation ◽

Functional Test ◽

Android Applications ◽

Test Scenarios

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Enhancement of Adaptive Software-Based Self Test Generation of Embedded Processors Cores

IFAC-PapersOnLine ◽

10.1016/j.ifacol.2019.12.732 ◽

2019 ◽

Vol 52 (27) ◽

pp. 56-61

Author(s):

Ján Hudec

Keyword(s):

Test Generation ◽

Embedded Processors ◽

Adaptive Software ◽

Self Test

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