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Dynamic test emulation for EDA-based mixed-signal test development automation
Proceedings of 1995 IEEE International Test Conference (ITC)
◽
10.1109/test.1995.529907
◽
2002
◽
Cited By ~ 1
Author(s):
Jean Qincui Xia
◽
T. Austin
◽
N. Khouzam
Keyword(s):
Test Development
◽
Dynamic Test
◽
Mixed Signal
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References
FPGA based chip emulation system for test development and verification of analog and mixed signal circuits (abstract only)
Proceedings of the 18th annual ACM/SIGDA international symposium on Field programmable gate arrays - FPGA '10
◽
10.1145/1723112.1723165
◽
2010
◽
Author(s):
Rahul Bhattachrya
◽
Santosh Biswas
◽
Siddhartha Mukhopadhyay
Keyword(s):
Test Development
◽
Mixed Signal
◽
Mixed Signal Circuits
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Test development and deployment tool-set for mixed-signal and digital devices
2008 11th International Biennial Baltic Electronics Conference
◽
10.1109/bec.2008.4657504
◽
2008
◽
Author(s):
A. Mellik
◽
J. Raik
Keyword(s):
Test Development
◽
Mixed Signal
◽
Digital Devices
◽
Tool Set
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Analog & Mixed-Signal are Key for Test Development Engineering Program
2008 IEEE International Test Conference
◽
10.1109/test.2008.4700665
◽
2008
◽
Author(s):
T.I. Schmitz
Keyword(s):
Test Development
◽
Mixed Signal
◽
Engineering Program
◽
Development Engineering
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HP94000 multi-site mixed signal test development considerations
IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309)
◽
10.1109/imtc.1999.776088
◽
2003
◽
Cited By ~ 1
Author(s):
S. Jannesari
Keyword(s):
Test Development
◽
Mixed Signal
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FPGA based chip emulation system for test development of analog and mixed signal circuits: A case study of DC–DC buck converter
Measurement
◽
10.1016/j.measurement.2012.04.022
◽
2012
◽
Vol 45
(8)
◽
pp. 1997-2020
◽
Cited By ~ 4
Author(s):
R. Bhattacharya
◽
S. Biswas
◽
S. Mukhopadhyay
Keyword(s):
Test Development
◽
Buck Converter
◽
Mixed Signal
◽
Mixed Signal Circuits
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Mixed signal test development in a virtual test environment
10.1049/ic:19971199
◽
1997
◽
Author(s):
J.J. O'Riordan
Keyword(s):
Test Development
◽
Test Environment
◽
Mixed Signal
◽
Virtual Test
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An XML-based test development and deployment framework for mixed-signal and digital devices
2008 IEEE AUTOTESTCON
◽
10.1109/autest.2008.4662628
◽
2008
◽
Cited By ~ 1
Author(s):
Andres Mellik
◽
Jaan Raik
Keyword(s):
Test Development
◽
Mixed Signal
◽
Digital Devices
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IP Session 3C: Automatic Test Development for Mixed-Signal/RF Circuits
26th IEEE VLSI Test Symposium (vts 2008)
◽
10.1109/vts.2008.68
◽
2008
◽
Keyword(s):
Test Development
◽
Rf Circuits
◽
Automatic Test
◽
Mixed Signal
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Mixed-signal test development using open standard modeling and description languages
2009 IEEE Behavioral Modeling and Simulation Workshop
◽
10.1109/bmas.2009.5338885
◽
2009
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Cited By ~ 1
Author(s):
Ping Lu
◽
Daniel Glaser
◽
Guerkan Uygur
◽
Susanne Weichslgartner
◽
Klaus Helmreich
◽
...
Keyword(s):
Test Development
◽
Mixed Signal
◽
Open Standard
◽
Description Languages
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The LEMMA developer's toolbox: semi-automated test development for analog and mixed-signal circuits
ISCAS '98. Proceedings of the 1998 IEEE International Symposium on Circuits and Systems (Cat. No.98CH36187)
◽
10.1109/iscas.1998.706963
◽
2002
◽
Cited By ~ 3
Author(s):
M.P. Kennedy
◽
P. Grogan
◽
J. O'Donnell
◽
T. O'Dwyer
◽
A. Wrixon
Keyword(s):
Test Development
◽
Mixed Signal
◽
Mixed Signal Circuits
◽
Automated Test
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