A detailed analysis of GOS defects in MOS transistors: testing implications at circuit level
1992 ◽
Vol 39
(4)
◽
pp. 874-882
◽
2020 ◽
Vol 67
(8)
◽
pp. 3035-3041
2009 ◽
Vol 19
(3)
◽
pp. 97-102
Keyword(s):
1988 ◽
Vol 49
(C4)
◽
pp. C4-651-C4-655
◽