Parallel delay fault coverage and test quality evaluation

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529824 ◽

2002 ◽

Cited By ~ 1

Author(s):

I. Pramanick ◽

A.K. Pramanick

Keyword(s):

Quality Evaluation ◽

Fault Coverage ◽

Test Quality ◽

Delay Fault

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Distributed solutions to the delay fault test quality evaluation problem

Proceedings of 3rd IEEE International Symposium on High Performance Distributed Computing ◽

10.1109/hpdc.1994.340246 ◽

2002 ◽

Cited By ~ 1

Author(s):

I. Pramanick ◽

A.K. Pramanick

Keyword(s):

Quality Evaluation ◽

Test Quality ◽

Delay Fault ◽

Distributed Solutions ◽

Evaluation Problem

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Flip–flop selection for partial enhance scan chain using DTESFF for high transition delay fault coverage

International Journal of Systems Assurance Engineering and Management ◽

10.1007/s13198-013-0170-9 ◽

2013 ◽

Vol 4 (3) ◽

pp. 303-311 ◽

Cited By ~ 2

Author(s):

Ashok Kumar Suhag ◽

Vivek Shrivastava ◽

Nidhi Singh

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Flip Flop ◽

High Transition ◽

Selection For ◽

Transition Delay ◽

Scan Chain

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Nonenumerative path delay fault coverage estimation with optimal algorithms

Proceedings International Conference on Computer Design VLSI in Computers and Processors ICCD-97 ◽

10.1109/iccd.1997.628896 ◽

2002 ◽

Cited By ~ 1

Author(s):

D. Kagaris ◽

S. Tragoudas ◽

D. Karayiannis

Keyword(s):

Fault Coverage ◽

Optimal Algorithms ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault ◽

Coverage Estimation ◽

Fault Coverage Estimation

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Improved delay fault coverage in SoC using controllable multi-Scan-Enable

2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology ◽

10.1109/icsict.2010.5667837 ◽

2010 ◽

Author(s):

Jin-yi Zhang ◽

Xu-hui Huang ◽

Wan-lin Cai ◽

Han-yi Weng

Keyword(s):

Fault Coverage ◽

Delay Fault

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Improving small-delay fault coverage for on-chip delay measurement

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378223 ◽

2012 ◽

Cited By ~ 4

Author(s):

Wenpo Zhang ◽

Kazuteru Namba ◽

Hideo Ito

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Delay Measurement ◽

Small Delay ◽

On Chip

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Delay fault coverage and performance tradeoffs

Proceedings of the 30th international on Design automation conference - DAC '93 ◽

10.1145/157485.164970 ◽

1993 ◽

Cited By ~ 62

Author(s):

William K. Lam ◽

Alexander Saldanha ◽

Robert K. Brayton ◽

Alberto L. Sangiovanni-Vincentelli

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

And Performance

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Exact Delay Fault Coverage in Sequential Logic Under Any Delay Fault Model

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2006.882583 ◽

2006 ◽

Vol 25 (12) ◽

pp. 2954-2964 ◽

Cited By ~ 3

Author(s):

Mahilchi Milir Vaseekar Kumar ◽

Spyros Tragoudas ◽

Sreejit Chakravarty ◽

Rathish Jayabharathi

Keyword(s):

Fault Coverage ◽

Fault Model ◽

Delay Fault ◽

Sequential Logic

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Static variable ordering in ZBDDs for path delay fault coverage calculation

The 2004 47th Midwest Symposium on Circuits and Systems, 2004. MWSCAS '04. ◽

10.1109/mwscas.2004.1354036 ◽

2004 ◽

Cited By ~ 2

Author(s):

F. Kocan ◽

M. Gunes ◽

M.A. Thornton

Keyword(s):

Fault Coverage ◽

Path Delay ◽

Delay Fault ◽

Variable Ordering ◽

Path Delay Fault

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Exact path delay fault coverage with fundamental zbdd operations

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2002.807891 ◽

2003 ◽

Vol 22 (3) ◽

pp. 305-316 ◽

Cited By ~ 36

Author(s):

S. Padmanaban ◽

M.K. Michael ◽

S. Tragoudas

Keyword(s):

Fault Coverage ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault

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On the fault coverage of delay fault detecting tests

Proceedings of the European Design Automation Conference, 1990., EDAC. ◽

10.1109/edac.1990.136669 ◽

2002 ◽

Cited By ~ 14

Author(s):

A.K. Pramanick ◽

S.M. Reddy

Keyword(s):

Fault Coverage ◽

Delay Fault

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