Automatic Test Program Generation for Mixed Signal ICs via Design To Test Link

2005 ◽  
Author(s):  
W. Kao ◽  
J. Xia ◽  
T. Boydston
Keyword(s):  
Automatic Test ◽  
Test Program ◽  
Mixed Signal ◽  
Program Generation

Mixed-signal automatic test program generation

2002 ◽  
Author(s):  
A. Keady ◽  
C. Lyden ◽  
J. Ryan ◽  
S. Claffey ◽  
N. Murphy ◽  
...  
Keyword(s):  
Automatic Test ◽  
Test Program ◽  
Mixed Signal ◽  
Program Generation

Automatic test program generation: a case study

2004 ◽  
Vol 21 (2) ◽  
pp. 102-109 ◽  
Author(s):  
F. Corno ◽  
E. Sanchez ◽  
M.S. Reorda ◽  
G. Squillero
Keyword(s):  
Automatic Test ◽  
Test Program ◽  
Program Generation

Automatic test program generation for analog circuits: The self‐testing approach

1987 ◽  
Vol 10 (4) ◽  
pp. 453-462
Author(s):  
Chyun‐Shin Cheng ◽  
Yih‐Yih Wu ◽  
Da‐Hong Chen ◽  
Chwan‐Chia Wu
Keyword(s):  
Analog Circuits ◽  
The Self ◽  
Automatic Test ◽  
Test Program ◽  
Program Generation ◽  
Self Testing ◽  
Testing Approach
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