Sequential test generation based on real-valued logic simulation

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527802 ◽

1992 ◽

Cited By ~ 18

Author(s):

K. Hatayama ◽

K. Hikone ◽

M. Ikeda ◽

T. Hayashi

Keyword(s):

Test Generation ◽

Sequential Test ◽

Logic Simulation

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Efficient sequential test generation based on logic simulation

IEEE Design & Test of Computers ◽

10.1109/mdt.2002.1033793 ◽

2002 ◽

Vol 19 (5) ◽

pp. 56-64 ◽

Cited By ~ 13

Author(s):

Shuo Sheng ◽

M.S. Hsiao

Keyword(s):

Test Generation ◽

Sequential Test ◽

Logic Simulation

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A parallel sequential test generation system DESCARTES based on real-valued logic simulation

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485344 ◽

2002 ◽

Author(s):

H. Date ◽

M. Nakao ◽

K. Hatayama

Keyword(s):

Test Generation ◽

Sequential Test ◽

Generation System ◽

Logic Simulation

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Recent advances in sequential test generation

Digest of Papers. 1992 IEEE VLSI Test Symposium ◽

10.1109/vtest.1992.232759 ◽

2003 ◽

Author(s):

Kwang-Ting Cheng

Keyword(s):

Test Generation ◽

Sequential Test ◽

Recent Advances

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The BACK algorithm for sequential test generation

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25661 ◽

2003 ◽

Cited By ~ 127

Author(s):

W.-T. Cheng

Keyword(s):

Test Generation ◽

Sequential Test

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Sequential test generation and synthesis for testability at the register-transfer and logic levels

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.277606 ◽

1993 ◽

Vol 12 (5) ◽

pp. 579-598 ◽

Cited By ~ 35

Author(s):

A. Ghosh ◽

S. Devadas ◽

A.R. Newton

Keyword(s):

Test Generation ◽

Sequential Test ◽

Synthesis For Testability ◽

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Subsets of Primary Input Vectors in Sequential Test Generation for Single Stuck-at Faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2157158 ◽

2011 ◽

Vol 30 (10) ◽

pp. 1579-1583 ◽

Cited By ~ 2

Author(s):

Irith Pomeranz

Keyword(s):

Test Generation ◽

Sequential Test ◽

Primary Input

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TOV: Sequential Test Generation by Ordering of Test Vectors

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2010.2041985 ◽

2010 ◽

Vol 29 (3) ◽

pp. 454-465 ◽

Cited By ~ 7

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Test Generation ◽

Sequential Test ◽

Test Vectors

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Sequential test generation with advanced illegal state search

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639686 ◽

2002 ◽

Cited By ~ 5

Author(s):

M.H. Konijnenburg ◽

J.Th. van der Linden ◽

A.J. van de Goor

Keyword(s):

Test Generation ◽

Sequential Test

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Sequential test generation based on circuit pseudo-transformation

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643919 ◽

2002 ◽

Cited By ~ 3

Author(s):

S. Ohtake ◽

T. Inoue ◽

H. Fujiwara

Keyword(s):

Test Generation ◽

Sequential Test

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Sequential test generation in massive observability environments

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367243 ◽

2002 ◽

Cited By ~ 2

Author(s):

P. Varma

Keyword(s):

Test Generation ◽

Sequential Test

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