Insights Into Correlation Between Board-Level Drop Reliability and Package-Level Ball Impact Test Characteristics

2007 ◽  
Vol 30 (1) ◽  
pp. 84-91 ◽  
Author(s):  
Chang-Lin Yeh ◽  
Yi-Shao Lai
2006 ◽  
Vol 129 (1) ◽  
pp. 98-104 ◽  
Author(s):  
Chang-Lin Yeh ◽  
Yi-Shao Lai

The ball impact test is developed as a package-level measure of the board-level reliability of solder joints in the sense that it leads to brittle intermetallic fracturing, similar to that from a board-level drop test. Following classical structural dynamics principles, the ball impact test process is analyzed to provide insights into transient characteristics of this particular test methodology. A design guideline for the ball impact test apparatus based on characteristics of the measured impact force profile is proposed.


2007 ◽  
Vol 47 (7) ◽  
pp. 1127-1134 ◽  
Author(s):  
Chang-Lin Yeh ◽  
Yi-Shao Lai ◽  
Hsiao-Chuan Chang ◽  
Tsan-Hsien Chen

2007 ◽  
Vol 47 (12) ◽  
pp. 2179-2187 ◽  
Author(s):  
Yi-Shao Lai ◽  
Hsiao-Chuan Chang ◽  
Chang-Lin Yeh
Keyword(s):  

2008 ◽  
Vol 48 (7) ◽  
pp. 1069-1078 ◽  
Author(s):  
E.H. Wong ◽  
R. Rajoo ◽  
S.K.W. Seah ◽  
C.S. Selvanayagam ◽  
W.D. van Driel ◽  
...  

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