Investigations of SiC MOSFET Short-Circuit Failure Mechanisms Using Electrical, Thermal, and Mechanical Stress Analyses
2020 ◽
Vol 67
(10)
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pp. 4328-4334
2020 ◽
Vol 167
(4)
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pp. 044514
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Keyword(s):
2019 ◽
Vol 100-101
◽
pp. 113454
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2018 ◽
Vol 57
(7)
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pp. 074102
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1999 ◽
Vol 14
(1)
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pp. 108-116
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2013 ◽
Vol 732-733
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pp. 1069-1073
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