Investigation of Traps in Thin-Film Organic Semiconductors Using Differential Analysis of Steady-State Current–Voltage Characteristics
2018 ◽
Vol 65
(8)
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pp. 3430-3437
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1984 ◽
Vol 772
(3)
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pp. 307-312
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1997 ◽
Vol 12
(11)
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pp. 1498-1499
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2010 ◽
Vol 54
(12)
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pp. 1511-1519
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2013 ◽
Vol 14
(8)
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pp. 2034-2038
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