Enhanced Negative Bias Stress Degradation in Multigate Polycrystalline Silicon Thin-Film Transistors

2017 ◽  
Vol 64 (10) ◽  
pp. 4363-4367 ◽  
Author(s):  
Dongli Zhang ◽  
Mingxiang Wang ◽  
Huaisheng Wang ◽  
Yilin Yang
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Negative Bias ◽  
Silicon Thin Film ◽  
Bias Stress ◽  
Stress Degradation

Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin film transistors under AC gate bias stress

2017 ◽  
Vol 32 (2) ◽  
pp. 91-96
Author(s):  
张猛 ZHANG Meng ◽  
夏之荷 XIA Zhi-he ◽  
周玮 ZHOU Wei ◽  
陈荣盛 CHEN Rong-sheng ◽  
王文 WONG Man ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Silicon Thin Film ◽  
Bias Stress ◽  
Gate Bias Stress

Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress

2011 ◽  
Vol 98 (12) ◽  
pp. 122101 ◽  
Author(s):  
Chia-Sheng Lin ◽  
Ying-Chung Chen ◽  
Ting-Chang Chang ◽  
Fu-Yen Jian ◽  
Hung-Wei Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Subthreshold Swing ◽  
Gate Bias ◽  
Silicon Thin Film ◽  
Bias Stress ◽  
Gate Bias Stress
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