Investigation of Human-Body-Model and Machine-Model ESD Robustness on Stacked Low-Voltage Field-Oxide Devices for High-Voltage Applications
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2006 ◽
Vol 20
(6)
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pp. 63-68
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1998 ◽
Vol 13
(9)
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pp. 967-971
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2009 ◽
Vol 23
(17)
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pp. 3586-3590
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