Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation
2015 ◽
Vol 62
(6)
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pp. 1811-1818
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2014 ◽
Vol 185
(6)
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pp. 1747-1758
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2013 ◽
Vol 12
(2)
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pp. 168-173
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2008 ◽
Vol 35
(6)
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pp. 1098-1108
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