Photo-Induced Coplanar Waveguide RF Switch and Optical Crosstalk on High-Resistivity Silicon Trap-Rich Passivated Substrate

2013 ◽  
Vol 60 (10) ◽  
pp. 3478-3484 ◽  
Author(s):  
Khaled Ben Ali ◽  
Cesar Roda Neve ◽  
Ali Gharsallah ◽  
Jean-Pierre Raskin
2007 ◽  
Vol 49 (4) ◽  
pp. 808-810 ◽  
Author(s):  
G. Poesen ◽  
G. Koers ◽  
J. Stiens ◽  
G. Carchon ◽  
W. De Raedt ◽  
...  

2012 ◽  
Vol 4 (4) ◽  
pp. 421-433 ◽  
Author(s):  
Giorgio De Angelis ◽  
Andrea Lucibello ◽  
Emanuela Proietti ◽  
Romolo Marcelli ◽  
Giancarlo Bartolucci ◽  
...  

Two different topologies of radio frequency micro-electro-mechanical system (RF MEMS) series ohmic switches (cantilever and clamped–clamped beams) in coplanar waveguide (CPW) configuration have been characterized by means of DC, environmental, and RF measurements. In particular, on-wafer checks have been followed by RF test after vibration, thermal shocks, and temperature cycles. The devices have been manufactured on high resistivity silicon substrates, as building blocks to be implemented in different single-pole 4-throw (SP4 T), double-pole double-throw (DPDT) configurations, and then integrated in Low Temperature Co-fired Ceramics (LTCC) technology for the realization of large-order Clos 3D networks.


2020 ◽  
Vol 12 (7) ◽  
pp. 615-628
Author(s):  
Lucas Nyssens ◽  
Martin Rack ◽  
Jean-Pierre Raskin

AbstractThe effective resistivity (ρeff) is a figure of merit commonly used to assess the radio-frequency performance of a substrate from the measurements of coplanar waveguide lines. For highly resistive substrates, such as the trap-rich (TR) substrate, the extracted ρeff decreases by several orders of magnitude at millimeter-wave frequencies. The explanation for this decay is twofold. First, the imaginary part of the characteristic impedance ${\rm \lpar \Im }\lpar Z_c\rpar \rpar$ is not well extracted, which leads to an incorrect separation of the total losses among the metal and substrate losses. Second, the original expression of ρeff does not include dielectric losses, which might become non-negligible at millimeter-wave frequencies. This paper solves both issues by presenting a new procedure to extract ρeff and the dielectric losses simultaneously, and by introducing a novel method to correct ${\rm \Im }\lpar {Z_c} \rpar$. Furthermore, it is shown that this extraction method enables the correct extraction of substrate parameters up to 220 GHz of TR and high-resistivity silicon substrates. Finally, the origin of the large extracted value of dielectric loss is discussed in the potential presence of surface roughness and surface wave radiation. Both phenomena are discounted thanks to measurements of an additional reflective structure and a standard impedance substrate.


1992 ◽  
Vol 28 (24) ◽  
pp. 2209 ◽  
Author(s):  
R.N. Simons ◽  
S.R. Taub ◽  
P.G. Young

2014 ◽  
Vol 6 (3-4) ◽  
pp. 277-285 ◽  
Author(s):  
Adrián Contreras ◽  
Jasmina Casals-Terré ◽  
Lluís Pradell ◽  
Flavio Giacomozzi ◽  
Jacopo Iannacci ◽  
...  

In this paper, a uniplanar RF-MEMS second-order bandpass filter with reconfigurable center frequency is presented. It is based on quarter-wavelength slotline resonators and coplanar waveguide (CPW)-to-slotline multimodal immitance inverters (MIIs), which are reconfigured using RF-MEMS switchable CPW air-bridges (SABs). The filter can be adequately explained and designed using multimodal theory and circuit models. A surface micromachining process on high-resistivity silicon substrate was used to fabricate the filter. Experimental results show frequency reconfiguration from 12 to 13 GHz, maintaining the same relative bandwidth, and insertion losses of 4.6 and 4.7 dB, respectively.


1988 ◽  
Vol 49 (C4) ◽  
pp. C4-363-C4-366 ◽  
Author(s):  
V. RADEKA ◽  
P. REHAK ◽  
S. RESCIA ◽  
E. GATTI ◽  
A. LONGONI ◽  
...  

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