Electrical Degradation and Recovery of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors With Various Metal Gate Patterns

Jiun-Jye Chang; Kuei-Shu Chang-Liao; Chen-Chien Li

doi:10.1109/ted.2012.2219053

Electrical Degradation and Recovery of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors With Various Metal Gate Patterns

IEEE Transactions on Electron Devices ◽

10.1109/ted.2012.2219053 ◽

2012 ◽

Vol 59 (12) ◽

pp. 3543-3548

Author(s):

Jiun-Jye Chang ◽

Kuei-Shu Chang-Liao ◽

Chen-Chien Li

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Metal Gate ◽

Silicon Thin Film ◽

Electrical Degradation

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Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C–V measurement analysis

Thin Solid Films ◽

10.1016/j.tsf.2006.07.127 ◽

2006 ◽

Vol 515 (3) ◽

pp. 1206-1209 ◽

Cited By ~ 5

Author(s):

Shih-Che Huang ◽

Yu-Han Kao ◽

Ya-Hsiang Tai

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Electrical Degradation ◽

Measurement Analysis ◽

P Type

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A Research About P-type Polycrystalline Silicon Thin Film Transistors of Low Temperature with Metal Gate Electrode and High Temperature with Gate Poly Silicon

Journal of the Korean Institute of Electrical and Electronic Material Engineers ◽

10.4313/jkem.2011.24.6.433 ◽

2011 ◽

Vol 24 (6) ◽

pp. 433-439

Author(s):

Jin-Min Lee

Keyword(s):

Thin Film ◽

High Temperature ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Gate Electrode ◽

Metal Gate ◽

Silicon Thin Film ◽

Poly Silicon ◽

P Type

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Electrical Degradation and Recovery of Low-Temperature Polycrystalline Silicon Thin-Film Transistors in Polycrystalline Silicon Plasma Process

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2153855 ◽

2011 ◽

Vol 58 (8) ◽

pp. 2448-2455 ◽

Cited By ~ 1

Author(s):

Jiun-Jye Chang ◽

Kuei-Shu Chang-Liao ◽

Tien-Ko Wang ◽

Yung-Chun Wu ◽

Kao-Chao Lin ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Plasma Process ◽

Silicon Thin Film ◽

Electrical Degradation

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Pixel-Level Digital-to-Analog Conversion Scheme for Compact Data Drivers of Active Matrix Organic Light-Emitting Diodes with Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.03cd03 ◽

2010 ◽

Vol 49 (3) ◽

pp. 03CD03 ◽

Cited By ~ 7

Author(s):

Tae-Wook Kim ◽

Byong-Deok Choi

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Organic Light Emitting Diodes ◽

Silicon Thin Film ◽

Active Matrix ◽

Light Emitting ◽

Organic Light ◽

Conversion Scheme

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Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.4021 ◽

2007 ◽

Vol 46 (7A) ◽

pp. 4021-4027 ◽

Cited By ~ 3

Author(s):

Hitoshi Ueno ◽

Yuta Sugawara ◽

Hiroshi Yano ◽

Tomoaki Hatayama ◽

Yukiharu Uraoka ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Gate Oxide ◽

Silicon Thin Film

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New Bidirectional T-Shaped Triple-Gate n-Type Polycrystalline Silicon Thin-Film Transistors Formed by Low-Temperature Sequential Lateral Solidification Process to Reduce of Kink Effects

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.034201 ◽

2011 ◽

Vol 50 ◽

pp. 034201

Author(s):

Sung-Hwan Choi ◽

Min-Koo Han

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Solidification Process ◽

Silicon Thin Film ◽

Sequential Lateral Solidification

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Influence of flexible substrate in low temperature polycrystalline silicon thin-film transistors: temperature dependent characteristics and low frequency noise analysis

Nanotechnology ◽

10.1088/1361-6528/ab98ba ◽

2020 ◽

Vol 31 (43) ◽

pp. 435201

Author(s):

Donghyun Kim ◽

Jungchun Kim ◽

Haeyong Kang ◽

Jae Won Shim ◽

Jae Woo Lee

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Flexible Substrate ◽

Noise Analysis ◽

Low Frequency ◽

Frequency Noise ◽

Temperature Dependent ◽

Silicon Thin Film

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Estimation of the mobility of low temperature polycrystalline silicon thin film transistors through deep learning

Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXVI ◽

10.1117/12.2579492 ◽

2021 ◽

Author(s):

Akira Mizutani ◽

Fuminobu Hamano ◽

Keita Katayama ◽

Daisuke Nakamura ◽

Tetsuya Goto ◽

...

Keyword(s):

Thin Film ◽

Deep Learning ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

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Erratum: “Controllability of self-aligned four-terminal planar embedded metal double-gate low-temperature polycrystalline-silicon thin-film transistors on a glass substrate”

Japanese Journal of Applied Physics ◽

10.7567/jjap.56.129207 ◽

2017 ◽

Vol 56 (12) ◽

pp. 129207

Author(s):

Hiroki Ohsawa ◽

Shun Sasaki ◽

Akito Hara

Keyword(s):

Thin Film ◽

Low Temperature ◽

Glass Substrate ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Double Gate ◽

Silicon Thin Film

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Electrical Hysteresis Behavior of Low Temperature Polycrystalline Silicon Thin Film Transistors

ECS Meeting Abstracts ◽

10.1149/ma2006-02/33/1583 ◽

2006 ◽

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hysteresis Behavior ◽

Electrical Hysteresis

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