Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C–V measurement analysis

Shih-Che Huang; Yu-Han Kao; Ya-Hsiang Tai

doi:10.1016/j.tsf.2006.07.127

Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C–V measurement analysis

Thin Solid Films ◽

10.1016/j.tsf.2006.07.127 ◽

2006 ◽

Vol 515 (3) ◽

pp. 1206-1209 ◽

Cited By ~ 5

Author(s):

Shih-Che Huang ◽

Yu-Han Kao ◽

Ya-Hsiang Tai

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Electrical Degradation ◽

Measurement Analysis ◽

P Type

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Photo sensitivity of p-type low-temperature polycrystalline silicon thin-film transistors by adjusting the channel doping dosage

The 4th IEEE International NanoElectronics Conference ◽

10.1109/inec.2011.5991743 ◽

2011 ◽

Author(s):

Yih-Shing Lee ◽

Ching-Chuan Liao ◽

Hong-Yi Luo ◽

Jack Tsai

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

P Type

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Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes

IEEE Electron Device Letters ◽

10.1109/led.2019.2942102 ◽

2019 ◽

Vol 40 (11) ◽

pp. 1768-1771 ◽

Cited By ~ 3

Author(s):

Hong-Yi Tu ◽

Tsung-Ming Tsai ◽

Chia-Chuan Wu ◽

Yu-Ching Tsao ◽

Mao-Chou Tai ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Grain Sizes ◽

Bias Temperature Instability ◽

P Type

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A Research About P-type Polycrystalline Silicon Thin Film Transistors of Low Temperature with Metal Gate Electrode and High Temperature with Gate Poly Silicon

Journal of the Korean Institute of Electrical and Electronic Material Engineers ◽

10.4313/jkem.2011.24.6.433 ◽

2011 ◽

Vol 24 (6) ◽

pp. 433-439

Author(s):

Jin-Min Lee

Keyword(s):

Thin Film ◽

High Temperature ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Gate Electrode ◽

Metal Gate ◽

Silicon Thin Film ◽

Poly Silicon ◽

P Type

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Electrical Degradation and Recovery of Low-Temperature Polycrystalline Silicon Thin-Film Transistors in Polycrystalline Silicon Plasma Process

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2153855 ◽

2011 ◽

Vol 58 (8) ◽

pp. 2448-2455 ◽

Cited By ~ 1

Author(s):

Jiun-Jye Chang ◽

Kuei-Shu Chang-Liao ◽

Tien-Ko Wang ◽

Yung-Chun Wu ◽

Kao-Chao Lin ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Plasma Process ◽

Silicon Thin Film ◽

Electrical Degradation

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A single-clock-driven gate driver using p-type, low-temperature polycrystalline silicon thin-film transistors

Journal of Information Display ◽

10.1080/15980316.2011.555515 ◽

2011 ◽

Vol 12 (1) ◽

pp. 61-67 ◽

Cited By ~ 1

Author(s):

Kang-Nam Kim ◽

Jin-Seong Kang ◽

Sung-Jin Ahn ◽

Jae Sic Lee ◽

Dong Hoon Lee ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Gate Driver ◽

P Type

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Electrical Degradation and Recovery of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors With Various Metal Gate Patterns

IEEE Transactions on Electron Devices ◽

10.1109/ted.2012.2219053 ◽

2012 ◽

Vol 59 (12) ◽

pp. 3543-3548

Author(s):

Jiun-Jye Chang ◽

Kuei-Shu Chang-Liao ◽

Chen-Chien Li

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Metal Gate ◽

Silicon Thin Film ◽

Electrical Degradation

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A New Method for Determining the Subgap Density of States in n-/p-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistors

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2017.14028 ◽

2017 ◽

Vol 17 (5) ◽

pp. 2951-2958

Author(s):

Injae Lee ◽

Miryeon Kim ◽

Min-Ho Shin ◽

Hyungsoon Shin

Keyword(s):

Thin Film ◽

Low Temperature ◽

Density Of States ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

New Method ◽

Silicon Thin Film ◽

P Type

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Water-enhanced negative bias temperature instability in p-type low temperature polycrystalline silicon thin film transistors

Microelectronics Reliability ◽

10.1016/j.microrel.2013.07.082 ◽

2014 ◽

Vol 54 (1) ◽

pp. 30-32 ◽

Cited By ~ 5

Author(s):

Meng Zhang ◽

Wei Zhou ◽

Rongsheng Chen ◽

Man Wong ◽

Hoi-Sing Kwok

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

P Type

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Pixel-Level Digital-to-Analog Conversion Scheme for Compact Data Drivers of Active Matrix Organic Light-Emitting Diodes with Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.03cd03 ◽

2010 ◽

Vol 49 (3) ◽

pp. 03CD03 ◽

Cited By ~ 7

Author(s):

Tae-Wook Kim ◽

Byong-Deok Choi

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Organic Light Emitting Diodes ◽

Silicon Thin Film ◽

Active Matrix ◽

Light Emitting ◽

Organic Light ◽

Conversion Scheme

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Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.4021 ◽

2007 ◽

Vol 46 (7A) ◽

pp. 4021-4027 ◽

Cited By ~ 3

Author(s):

Hitoshi Ueno ◽

Yuta Sugawara ◽

Hiroshi Yano ◽

Tomoaki Hatayama ◽

Yukiharu Uraoka ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Gate Oxide ◽

Silicon Thin Film

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