Experimental Study of $\langle \hbox{110}\rangle$ Uniaxial Stress Effects on p-Channel GaAs Quantum-Well FETs

2011 ◽  
Vol 58 (8) ◽  
pp. 2597-2603 ◽  
Author(s):  
Ling Xia ◽  
Vadim Tokranov ◽  
Serge R. Oktyabrsky ◽  
Jesús A. del Alamo
2010 ◽  
Vol 33 (2) ◽  
pp. 278-286 ◽  
Author(s):  
Masaaki Koganemaru ◽  
Toru Ikeda ◽  
Noriyuki Miyazaki ◽  
Hajime Tomokage

Author(s):  
M. Namkung ◽  
R. DeNale ◽  
P.W. Kushnick ◽  
J.L. Grainger ◽  
R.G. Todhunter

2011 ◽  
Vol 31 (11) ◽  
pp. 1104001
Author(s):  
张家鑫 Zhang Jiaxin ◽  
许丽萍 Xu Liping ◽  
温廷敦 Wen Tingdun ◽  
王忠斌 Wang Zhongbin

1985 ◽  
Vol 46 ◽  
Author(s):  
Keon M. Lee ◽  
J. M. Trombetta ◽  
G. D. Watkins

AbstractThe effect of uniaxial stress on the NL8 EPR spectrum in 450°C heattreated silicon containing thermal donors (TD's) is described. Changes in the relative amplitudes of the NL8 spectral components are interpreted as arising from electronic redistribution between the differently oriented defects. These changes are consistent in sign and magnitude with those predicted for TD+ from observed stress effects on the TD IR and DLTS spectra.


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