Explanation of SILC Probability Density Distributions With Nonuniform Generation of Traps in the Tunnel Oxide of Flash Memory Arrays
2007 ◽
Vol 54
(8)
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pp. 1953-1962
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2018 ◽
Vol 233
(10)
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pp. 2099-2114
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2018 ◽
1998 ◽
Vol 426
(1-3)
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pp. 87-93
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Keyword(s):
1985 ◽
pp. 23-40
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