Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

doi:10.1109/ted.2007.897524

Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

IEEE Transactions on Electron Devices ◽

10.1109/ted.2007.897524 ◽

2007 ◽

Vol 54 (5) ◽

pp. 1274-1274

Keyword(s):

Negative Bias ◽

Special Issue ◽

Bias Temperature Instabilities

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Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

IEEE Electron Device Letters ◽

10.1109/led.2007.897548 ◽

2007 ◽

Vol 28 (5) ◽

pp. 465-465

Keyword(s):

Negative Bias ◽

Special Issue ◽

Bias Temperature Instabilities

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Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

IEEE Transactions on Electron Devices ◽

10.1109/ted.2007.900189 ◽

2007 ◽

Vol 54 (6) ◽

pp. 1580-1580 ◽

Cited By ~ 1

Keyword(s):

Negative Bias ◽

Special Issue ◽

Bias Temperature Instabilities

Download Full-text

Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

IEEE Electron Device Letters ◽

10.1109/led.2007.900199 ◽

2007 ◽

Vol 28 (6) ◽

pp. 532-532

Keyword(s):

Negative Bias ◽

Special Issue ◽

Bias Temperature Instabilities

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Impact of Negative Bias Temperature Instabilities on Lifetime in p-channel Power VDMOSFETs

2007 8th International Conference on Telecommunications in Modern Satellite, Cable and Broadcasting Services ◽

10.1109/telsks.2007.4375991 ◽

2007 ◽

Cited By ~ 5

Author(s):

Ninoslav Stojadinovic ◽

Danijel Dankovic ◽

Ivica Manic ◽

Vojkan Davidovic ◽

Snezana Djoric-Veljkovic ◽

...

Keyword(s):

Negative Bias ◽

Channel Power ◽

Bias Temperature Instabilities

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Extensive Study of the Correlation between Contact Etch Stop Nitride film Properties and Negative Bias Temperature Instabilities Measured in pMOSFETS

ECS Meeting Abstracts ◽

10.1149/ma2007-01/14/672 ◽

2007 ◽

Keyword(s):

Extensive Study ◽

Nitride Film ◽

Negative Bias ◽

Film Properties ◽

Etch Stop ◽

Bias Temperature Instabilities

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Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling

Microelectronics Reliability ◽

10.1016/j.microrel.2006.10.010 ◽

2007 ◽

Vol 47 (6) ◽

pp. 880-889 ◽

Cited By ~ 4

Author(s):

M. Houssa ◽

M. Aoulaiche ◽

S. De Gendt ◽

G. Groeseneken ◽

M.M. Heyns

Keyword(s):

Electrical Characterization ◽

Negative Bias ◽

Bias Temperature Instabilities

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Negative Bias Temperature Instabilities in SiO[sub 2]/HfO[sub 2]-Based Hole Channel FETs

Journal of The Electrochemical Society ◽

10.1149/1.1815154 ◽

2004 ◽

Vol 151 (12) ◽

pp. F288 ◽

Cited By ~ 3

Author(s):

M. Houssa ◽

S. De Gendt ◽

G. Groeseneken ◽

M. M. Heyns

Keyword(s):

Negative Bias ◽

Bias Temperature Instabilities

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A comparative study of positive and negative bias temperature instabilities in MOSFETs

10.1109/edms.1994.771280 ◽

2005 ◽

Author(s):

J.F. Zhang ◽

W. Eccleston

Keyword(s):

Comparative Study ◽

Negative Bias ◽

Bias Temperature Instabilities

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Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities

Microelectronics Reliability ◽

10.1016/j.microrel.2009.06.022 ◽

2009 ◽

Vol 49 (9-11) ◽

pp. 1008-1012 ◽

Cited By ~ 11

Author(s):

Christelle Bénard ◽

Gaëtan Math ◽

Pascal Fornara ◽

Jean-Luc Ogier ◽

Didier Goguenheim

Keyword(s):

Negative Bias ◽

Bias Temperature Instabilities

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Introduction to the Special Issue on Negative Bias Temperature Instability

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2008.919442 ◽

2008 ◽

Vol 8 (1) ◽

pp. 4-5

Author(s):

Giuseppe La Rosa ◽

Anand Krishnan

Keyword(s):

Negative Bias ◽

Special Issue ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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