Enhanced Breakdown Voltage, Diminished Quasi-Saturation, and Self-Heating Effects in SOI Thin-Film Bipolar Transistors for Improved Reliability: A TCAD Simulation Study
2006 ◽
Vol 6
(2)
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pp. 306-314
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Keyword(s):
2006 ◽
Vol 83
(2)
◽
pp. 303-311
◽
1997 ◽
Vol 45
(4)
◽
pp. 534-542
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Keyword(s):