Structural and Superconducting Properties of Laser-Deposited (110)-Oriented $\hbox{YBa}_{2}\hbox{Cu}_{3}\hbox{O}_{7 - \delta}$ Thin Films After In Situ Annealing

2013 ◽  
Vol 23 (3) ◽  
pp. 7200304-7200304
Author(s):  
P. Paturi ◽  
M. Rajala ◽  
H. Palonen ◽  
H. Huhtinen
Keyword(s):  
Thin Films ◽  
Superconducting Properties

Superconducting properties of two-step in situ annealed MgB2 thin films

2004 ◽  
Vol 412-414 ◽  
pp. 1371-1375 ◽  
Author(s):  
Zon Mori ◽  
Toshiya Doi ◽  
Yuichiro Ishizaki ◽  
Hitoshi Kitaguchi ◽  
Michiya Okada ◽  
...  
Keyword(s):  
Thin Films ◽  
Superconducting Properties ◽  
Mgb2 Thin Films

In‐Situ Growth of Superconducting Bi‐Sr‐Ca‐Cu‐O Thin Films by Activated Reactive Co‐evaporation

1989 ◽  
Vol 169 ◽  
Author(s):  
K. Yoshikawa ◽  
T. Satoh ◽  
N. Sasaki ◽  
M. Nakano
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Transition Temperature ◽  
Smooth Surface ◽  
Oxygen Plasma ◽  
In Situ Growth ◽  
Superconducting Properties ◽  
Cooling Conditions ◽  
Zero Resistance

AbstractThe effect of in‐situ cooling conditions on surface roughness and superconducting properties have been studied. Bi‐Sr‐Ca‐Cu‐0 thin films were grown in‐situ on (100) MgO substrates at 700°C by activated reactive co‐evaporation. The films cool‐down in 760 Torr oxygen showed a transition temperature (Tc(onset)) of 100 K and zero resistance temperature (Tc (zero)) of 65 K. Smooth surface was obtained for the sample cooled‐down in oxygen plasma.

nz.sbnd;dependence of superconducting properties in Bi2Sr2Can−1CunOy thin films prepared by in-situ MBE technique

1991 ◽  
Vol 185-189 ◽  
pp. 2011-2012 ◽  
Author(s):  
I. Tsukada ◽  
H. Watanabe ◽  
I. Terasaki ◽  
A. Maeda ◽  
K. Uchinokura
Keyword(s):  
Thin Films ◽  
Superconducting Properties

In situ growth and superconducting properties of YNi2B2C thin films

1996 ◽  
Vol 69 (1) ◽  
pp. 118-120 ◽  
Author(s):  
A. Andreone ◽  
M. Iavarone ◽  
R. Vaglio ◽  
P. Manini ◽  
E. Cogliati
Keyword(s):  
Thin Films ◽  
In Situ Growth ◽  
Superconducting Properties

Epitaxial Growth and Superconducting Properties of Yba2Cu3O7 Thin Films and Yba2Cu3O7/Dy(Pr)Yba2Cu3O7 Superlattices

1989 ◽  
Vol 169 ◽  
Author(s):  
J.-M. Triscone ◽  
M.G. Karkut ◽  
O. Brunner ◽  
L. Antognazza ◽  
A.D. Kent ◽  
...  
Keyword(s):  
Thin Films ◽  
Residual Resistivity ◽  
Unit Cell ◽  
Superconducting Properties ◽  
Single Target ◽  
Planar Magnetron ◽  
Zero Resistance ◽  
Superconducting Fluctuations ◽  
Modulation Wavelength

AbstractWe have prepared in situ REBa2Cu3O7 (REBCO) (RE= Y, Pr, Dy) thin films and YBC0/Dy(Pr)BC0 superlattices by single target dc planar magnetron sputtering. YBCO/DyBCO superlattices have been realized with modulation wavelength as short as 24Å, i.e., a unit cell of YBCO alternates with a unit cell of DyBCO, on average. The superconducting properties of such superlattices are indistinguishable from those of single layers. Tco's (zero resistance) are between 85 and 89K, and the residual resistivity ratios are between 2.5 and 3. In contrast to these results, when YBCO is layered with PrBCO, which is insulating, a dramatic change in the superconducting properties is observed. We have been able to artificially vary the coupling between single 12Å unit cell of YBCO by interposing insulating planes of PrBCO. As the YBCO layer separation increases, T is reduced and the transition broadens showing evidence of 2‐D superconducting fluctuations.

Superconducting properties of Y-Ba-Cu-O thin films grown in situ by laser ablation

1991 ◽  
Vol 180 (1-4) ◽  
pp. 77-80 ◽  
Author(s):  
Carmelo Romeo ◽  
Vincenzo Boffa ◽  
Sarah Bollanti ◽  
Gianfranco Paterno ◽  
Carlo Alvani ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Superconducting Properties

Nucleation and Early Growth of Sputtered thin Films

1970 ◽  
Vol 28 ◽  
pp. 516-517
Author(s):  
Dudley M. Sherman ◽  
Thos. E. Hutchinson
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Ion Beam ◽  
Ion Source ◽  
Water Cooling ◽  
Stages Of Growth ◽  
Lens Assembly ◽  
Microscope Technique ◽  
Ion Beam Sputter Deposition

The in situ electron microscope technique has been shown to be a powerful method for investigating the nucleation and growth of thin films formed by vacuum vapor deposition. The nucleation and early stages of growth of metal deposits formed by ion beam sputter-deposition are now being studied by the in situ technique.A duoplasmatron ion source and lens assembly has been attached to one side of the universal chamber of an RCA EMU-4 microscope and a sputtering target inserted into the chamber from the opposite side. The material to be deposited, in disc form, is bonded to the end of an electrically isolated copper rod that has provisions for target water cooling. The ion beam is normal to the microscope electron beam and the target is placed adjacent to the electron beam above the specimen hot stage, as shown in Figure 1.

Epitaxy and texture analysis of Bi-Sr-Ca-Cu-O thin films on (100) MgO using Transmission Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 68-69
Author(s):  
J. T. Sizemore ◽  
D. G. Schlom ◽  
Z. J. Chen ◽  
J. N. Eckstein ◽  
I. Bozovic ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Critical Currents ◽  
Unit Cell ◽  
X Ray Diffraction ◽  
Cell Axis ◽  
Transmission Electron ◽  
Synthesis Procedure

Investigators observe large critical currents for superconducting thin films deposited epitaxially on single crystal substrates. The orientation of these films is often characterized by specifying the unit cell axis that is perpendicular to the substrate. This omits specifying the orientation of the other unit cell axes and grain boundary angles between grains of the thin film. Misorientation between grains of YBa2Cu3O7−δ decreases the critical current, even in those films that are c axis oriented. We presume that these results are similar for bismuth based superconductors and report the epitaxial orientations and textures observed in such films.Thin films of nominally Bi2Sr2CaCu2Ox were deposited on MgO using molecular beam epitaxy (MBE). These films were in situ grown (during growth oxygen was incorporated and the films were not oxygen post-annealed) and shuttering was used to encourage c axis growth. Other papers report the details of the synthesis procedure. The films were characterized using x-ray diffraction (XRD) and transmission electron microscopy (TEM).

The use of transmission and analytical electron microscopy in studying reactions and phase transformations in thin film

1993 ◽  
Vol 51 ◽  
pp. 842-843
Author(s):  
K. Barmak
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Phase Transformations ◽  
Analytical Electron Microscopy ◽  
Ex Situ ◽  
Multilayer Thin Films ◽  
Absolute Concentration ◽  
Analytical Electron ◽  
Deposition Step

Generally, processing of thin films involves several annealing steps in addition to the deposition step. During the annealing steps, diffusion, transformations and reactions take place. In this paper, examples of the use of TEM and AEM for ex situ and in situ studies of reactions and phase transformations in thin films will be presented.The ex situ studies were carried out on Nb/Al multilayer thin films annealed to different stages of reaction. Figure 1 shows a multilayer with dNb = 383 and dAl = 117 nm annealed at 750°C for 4 hours. As can be seen in the micrograph, there are four phases, Nb/Nb3-xAl/Nb2-xAl/NbAl3, present in the film at this stage of the reaction. The composition of each of the four regions marked 1-4 was obtained by EDX analysis. The absolute concentration in each region could not be determined due to the lack of thickness and geometry parameters that were required to make the necessary absorption and fluorescence corrections.

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