Errata to "Electric field-based surface integral constraints for Helmholtz decompositions of the current on a conductor" [Sep 13 4632-4640]

2013 ◽  
Vol 61 (10) ◽  
pp. 5359-5359 ◽  
Author(s):  
Jin Cheng ◽  
Robert J. Adams
Keyword(s):  
Electric Field ◽  
Surface Integral ◽  
Integral Constraints

scholarly journals A Study on the Use of Compound and Extracted Models in the High Frequency Electromagnetic Exposure Assessment

2017 ◽  
Vol 2017 ◽  
pp. 1-12 ◽  
Author(s):  
Mario Cvetković ◽  
Hrvoje Dodig ◽  
Dragan Poljak
Keyword(s):  
Electric Field ◽  
High Frequency ◽  
Compound Eye ◽  
Numerical Results ◽  
Similar Distribution ◽  
Surface Integral ◽  
Hybrid Finite Element Method ◽  
Human Eye ◽  
Organ Models ◽  
Element Method

The paper presents the numerical results for the induced electric field in the various models of the human eye and the head. The comparison between the extracted or the single organ models and the compound organ models placed inside realistic head models obtained from the magnetic resonance imaging scans is presented. The numerical results for several frequencies and polarizations of the incident electromagnetic (EM) plane wave are obtained using the hybrid finite element method/boundary element method (FEM/BEM) formulation and the surface integral equation (SIE) based formulation featuring the use of method of moments, respectively. Although some previous analysis showed the similar distribution of the induced electric field along the pupillary axis obtained in both eye models, this study showed this not to be the case in general. The analysis showed that the compound eye model is much more suitable when taking into account the polarization of the incident EM wave. The numerical results for the brain models showed much better agreement in the maximum values and distributions of the induced surface field between detailed models, while homogeneous brain model showed better agreement with the compound model in the distribution along selected sagittal axis points. The analysis could provide some helpful insights when carrying out the dosimetric analysis of the human eye and the head/brain exposed to high frequency EM radiation.

scholarly journals The effect of near-zone preconditioning on electromagnetic integral equations of first and second kind

2013 ◽  
Vol 11 ◽  
pp. 61-65 ◽  
Author(s):  
O. Wiedenmann ◽  
T. F. Eibert
Keyword(s):  
Integral Equation ◽  
Electric Field ◽  
Integral Equations ◽  
Fast Multipole Method ◽  
Surface Integral ◽  
Electric Field Integral Equation ◽  
Integral Methods ◽  
Near Zone ◽  
Field Integral ◽  
Linear Equation Systems

Abstract. The linear equation systems which arise from the discretization of surface integral equations are conveniently solved with iterative methods because of the possibility to employ fast integral methods like the Multilevel Fast Multipole Method. However, especially integral equations of the first kind often lead to very ill-conditioned systems, which require the usage of effective preconditioners. In this paper, the regularization property of near-zone preconditioning operators on the Electric Field Integral Equation is demonstrated and investigated for problems of different size. Furthermore, comparisons are drawn to second-kind integral equations such as the Combined Field Integral Equation.

scholarly journals Protection of Impact Electromagnetic Radiation on Public Health and Environment, Indonesia

2021 ◽  
Vol 324 ◽  
pp. 05004
Author(s):  
Mujahidin Muhamad ◽  
Suhendra Tonny ◽  
Nugraha Sapta ◽  
Rusfa ◽  
Paramita Bunga
Keyword(s):  
Public Health ◽  
Vector Field ◽  
Electric Field ◽  
Scalar Potential ◽  
Radial Distance ◽  
Surface Integral ◽  
Simple Method ◽  
Energy Beam ◽  
Demand Distribution ◽  
Line Charge

A penetration of SUTET trajectory in residential areas, causing public health problems and environmental problems. Development of the electrical energy sector, regulation the increasing electricity demand. Distribution electricity from inter-GI generating centers requires SUTET in the air with a voltage above 245kV. The community assesses health impact that operates mostly with the voltage of 500 kV, >1000mA/m2, can cause heart problems, extrasystole rhythms, and ventricular fibrillation Electrical sensitivity. A simple method and integrating the divergence shift flux density a radiation point, a method proposed from Strokes theorem relates the closed line integral vector field to curl surface integral and divergence theorem which relates the surface integral a closed vector field to integral volume and divergence vector field, this experiment electric field produced by the line charge is directed radially away from the line charge, so the direction lines electric field(E), and equipotential surfaces perpendicular to each other. This study is a collection of symptoms hypersensitivity, comprehensively, and a potential difference between two points in the electric field, which has the performance of charge unity in responding to charge from both points the area, the solution is environmental-based management. Ionizing radiation is the dispersion or emission energy when through a medium, absorption process occurs, and radiation energy beam does not induce, results in vector potential having magnitude is inversely proportional the radial distance from the element which is similar to inverse distance dependence scalar potential. In conclusion, take steps to empower the community for residents in the area SUTET.

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

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