Analog IC test and product engineering curriculum for M

2014 ◽  
Author(s):  
N. A. Kamsani ◽  
R. M. Sidek ◽  
C. W. Yeo ◽  
D. Gan ◽  
C.T. Quek ◽  
...  
Keyword(s):  
Engineering Curriculum ◽  
Analog Ic ◽  
Product Engineering ◽  
Analog Ic Test ◽  
Ic Test

DDS-Based Analog IC Test System for Audio ICs

2021 ◽  
Author(s):  
Yu Yanling ◽  
Wei Tianyu ◽  
Zhao Zhiwei ◽  
Wang Bin ◽  
Wang Fang
Keyword(s):  
Test System ◽  
Analog Ic ◽  
Analog Ic Test ◽  
Ic Test

The Research of IC Test Based on LTX-77 Test System

2014 ◽  
Vol 496-500 ◽  
pp. 1176-1179
Author(s):  
Li Tan ◽  
Yu Fang
Keyword(s):  
Test Object ◽  
Test System ◽  
Test Method ◽  
Test Results ◽  
Analog Ic ◽  
Test Platform ◽  
Logic Functions ◽  
Actual Test ◽  
Ic Test

LTX-77 test system is a large IC test system that is used for various kinds of analog IC, digital IC and analog digital mixed IC. It can be used to test DC parameters, AC parameters and logic functions. In the paper, the IC test platform is LTX-77 test system. IC ADC0804 was tested as the test object. The test method of IC is described in the view of actual test. The test results show that the test system is convenient and accurate, which has important practical value for IC manufacturers and users.

University As A Social Entreprise:Modelling Enterprise 3.0 Application In Engineering Curriculum

2014 ◽  
Vol 1 (1) ◽  
pp. 393-398
Author(s):  
Andreas Ahrens ◽  
Olaf Bassus ◽  
Jeļena Zaščerinska
Keyword(s):  
Social Enterprise ◽  
Primary Data ◽  
Engineering Curriculum ◽  
Positive Direction ◽  
Social Agent ◽  
Primary Data Analysis ◽  
The Social ◽  
Technical Expert ◽  
Knowledge And Attitude ◽  
Broad Understanding

AbstractUniversity as a social enterprise has become the dominant response to the challenge of bringing up an engineer as a first-rate technical expert who acts as a social agent, rather than just a technician, with a “broad understanding of the social and philosophical context in which he will work” [3]. Aim of the research is to analyze student engineers' Enterprise 3.0 application in engineering curriculum. The meaning of the key concepts of university as a social enterprise, engineering curriculum and Enterprise 3.0 is studied. Explorative research has been used. The empirical study was conducted at Riga Technical University, Riga, Latvia, in 2011. Descriptive statistics was implemented for primary data analysis. The findings of the research allow drawing the conclusions on the favourable context of Enterprise 3.0 application in engineering curriculum as the student engineers' knowledge and attitude towards Enterprise 3.0 application are positive. Direction of further research are proposed.

ATE Failure Isolation Methodologies for Failure Analysis, Design Debug and Yield Enhancement

1998 ◽  
Author(s):  
D.S. Patrick ◽  
L.C. Wagner ◽  
P.T. Nguyen
Keyword(s):  
Integrated Circuits ◽  
Failure Analysis ◽  
Yield Enhancement ◽  
Production Test ◽  
Final Test ◽  
Critical Design ◽  
The Past ◽  
Product Engineering ◽  
Time Savings ◽  
Analysis Design

Abstract Failure isolation and debug of CMOS integrated circuits over the past several years has become increasingly difficult to perform on standard failure analysis functional testers. Due to the increase in pin counts, clock speeds, increased complexity and the large number of power supply pins on current ICS, smaller and less equipped testers are often unable to test these newer devices. To reduce the time of analysis and improve the failure isolation capabilities for failing ICS, failure isolation is now performed using the same production testers used in product development, multiprobe and final test. With these production testers, the test hardware, program and pattern sets are already available and ready for use. By using a special interface that docks the production test head to failure isolation equipment such as the emission microscope, liquid crystal station and E-Beam prober, the analyst can quickly and easily isolate the faillure on an IC. This also enables engineers in design, product engineering and the waferfab yield enhancement groups to utilize this equipment to quickly solve critical design and yield issues. Significant cycle time savings have been achieved with the migration to this method of electrical stimulation for failure isolation.

Laser Based Analysis on Analog Circuits with Feedback Loops and a Case Study

2006 ◽  
Author(s):  
Fubin Zhang ◽  
David Maxwell
Keyword(s):  
Success Rate ◽  
High Resistance ◽  
Analog Circuits ◽  
Analog Circuit ◽  
Feedback Loops ◽  
Induced Voltage ◽  
Analog Device ◽  
Analog Ic ◽  
Successful Isolation

Abstract Based on the understanding of laser based techniques’ physics theory and the topology/structure of analog circuit systems with feedback loops, the propagation of laser induced voltage/current alteration inside the analog IC is evaluated. A setup connection scheme is proposed to monitor this voltage/current alteration to achieve a better success rate in finding the fail site or defect. Finally, a case of successful isolation of a high resistance via on an analog device is presented.

Engineering for good: A case of community driven engineering innovation

2018 ◽  
Vol 6 (1) ◽  
Author(s):  
Chinweike Eseonu ◽  
Martin A Cortes
Keyword(s):  
Engineering Students ◽  
Technology Innovation ◽  
Local Communities ◽  
First Year ◽  
Engineering Curriculum ◽  
Engineering Design Process ◽  
The World ◽  
The University ◽  
Social Consideration

There is a culture of disengagement from social consideration in engineering disciplines. This means that first year engineering students, who arrive planning to change the world through engineering, lose this passion as they progress through the engineering curriculum. The community driven technology innovation and investment program described in this paper is an attempt to reverse this trend by fusing community engagement with the normal engineering design process. This approach differs from existing project or trip based approaches – outreach – because the focus is on local communities with which the university team forms a long-term partnership through weekly in-person meetings and community driven problem statements – engagement.

Informationsqualität in der Produktentwicklung: Modellbasiertes Systems Engineering mit expliziter Berücksichtigung von Unsicherheit/Information Quality in Product Engineering: Model-Based Systems Engineering in Explicit Consideration of Uncertainty

Konstruktion ◽  
2020 ◽  
Vol 72 (11-12) ◽  
pp. 76-83
Author(s):  
Jens Pottebaum ◽  
Iris Gräßler
Keyword(s):  
Systems Engineering ◽  
Information Quality ◽  
Engineering Model ◽  
Model Based ◽  
Product Engineering ◽  
Explicit Consideration ◽  
Model Based Systems Engineering

Inhalt Unscharfe Anforderungen, verschiedene Lösungs-alternativen oder eingeschränkt gültige Simulationsmodelle sind Beispiele für inhärente Unsicherheit in der Produktentwicklung. Im vorliegenden Beitrag wird ein modellbasierter Ansatz vorgestellt, der das industriell etablierte Denken in Sicherheitsfaktoren um qualitative Aspekte ergänzt. Modelle der Informationsqualität helfen, die Unsicherheit von Ent- wicklungsartefakten beschreibend zu charakterisieren. Mittels semantischer Technologien wird Unsicherheit so wirklich handhabbar – nicht im Sinne einer Berechnung, sondern im Sinne einer qualitativen Interpretation. Dadurch entsteht wertvolles Wissen für die iterative Anforderungsanalyse, die Bewertung alternativer System-Architekturen oder für die Rekonfiguration von Simulationen.

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