An Effortless Noninvasive Respiratory Diagnostic Device

2016 ◽  
Author(s):  
Jafar Vossoughi ◽  
Arthur Johnson
Keyword(s):  
Diagnostic Device

Adjuncts as a diagnostic of polysynthetic word formation in Inuit

2017 ◽  
Author(s):  
Richard Compton
Keyword(s):  
Head Movement ◽  
Word Formation ◽  
Diagnostic Device ◽  
Closed Class ◽  
Variable Ordering ◽  
Mirror Principle

This chapter examines polysynthetic word formation in Inuit (Eskimo-Aleut), using the presence and variable ordering of a closed class of adverbs within verbal complexes as a diagnostic device to evaluate the adequacy of different accounts of word formation. It is argued that a head movement account of Mirror Principle orders within Inuit words undergenerates with respect to the observed variation in adverb ordering, particularly if a fixed hierarchy of adverbial functional projections is assumed, as in Cinque (1999). Instead, it is shown that an analysis that employs a right-headed structure, XP-sized phasal words, and Ernst’s (2002) semantically based framework of adverb licensing better captures the observed variation.

Knee Injury Diagnostic Device

2020 ◽  
Author(s):  
Julie E. McKenna ◽  
Tyler R. Hopkins ◽  
Lucas T. Lavallee ◽  
Douglas E. Dow
Keyword(s):  
Knee Injury ◽  
Diagnostic Device

Interface Features of the DDR SDRAM Memory Test Diagnostic Device

2021 ◽  
Vol 26 (3-4) ◽  
pp. 282-290
Author(s):  
S.V. Volobuev ◽  
◽  
V.G. Ryabtsev ◽  
Keyword(s):  
Data Transmission ◽  
High Speed ◽  
Maximum Speed ◽  
Diagnostic Device ◽  
Semiconductor Memory ◽  
Storage Devices ◽  
Memory Modules ◽  
Electronic Elements ◽  
Synchronization Scheme ◽  
Test Diagnostics

The I/О synchronization scheme plays an important role in achieving maximum speed and reliability of data transmission during memory operation. This paper presents the interface architecture of the DDR SDRAM test diagnostic device. It was demonstrated that the proposed interface components provide the formation of a bidirectional synchro signal for gating written and read data when performing test diagnostics of chips and DDR SDRAM memory devices. Compared to traditional methods, the proposed interface components were made on integrated electronic elements, which reduced the size and power consumption. It has been established that the use of a multiphase synchronization system to implement the interface eliminated the use of delay lines, the disadvantages of which are large dimensions and the complexity of changing the delay time. The interface components under consideration are intended for use in test diagnostics devices that have a multiprocessor structure, which increases the speed of forming test actions and reference reactions. The performed functional modeling and debugging of strobe signal generators confirmed the feasibility of the designs. The proposed interface of the test diagnostics device allows performing test diagnostics of modern high-speed chips and semiconductor memory modules at the operating frequency, which increases the reliability of the results obtained. Interface components can be used by manufacturers of test diagnostics tools for modern high-speed storage devices.

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