Sensor location, identification, and multivariable iterative learning control of an RTP process for maximum uniformity of wafer temperature distribution
2000 ◽
Vol 33
(10)
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pp. 123-128
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2001 ◽
Vol 40
(7)
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pp. 1661-1672
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2003 ◽
Vol 16
(1)
◽
pp. 36-44
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2014 ◽
Vol 39
(5)
◽
pp. 565-573
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