PIFA: An Intelligent Phase Identification and Frequency Adjustment Framework for Time-Sensitive Mobile Computing

2019 ◽  
Author(s):  
Xia Zhang ◽  
Xusheng Xiao ◽  
Liang He ◽  
Yun Ma ◽  
Yangyang Huang ◽  
...  
Keyword(s):  
Mobile Computing ◽  
Phase Identification ◽  
Frequency Adjustment

Applications of Through-Focus Dark Field Image Shifts to Phase Identification

1975 ◽  
Vol 33 ◽  
pp. 178-179
Author(s):  
Prakash Rao
Keyword(s):  
Dark Field Image ◽  
Thin Foil ◽  
Dark Field ◽  
The Other ◽  
Stereo Image ◽  
Phase Identification ◽  
The Past ◽  
Field Electron Microscopy ◽  
Dark Field Electron ◽  
Recent Extension

Image shifts in out-of-focus dark field images have been used in the past to determine, for example, epitaxial relationships in thin films. A recent extension of the use of dark field image shifts has been to out-of-focus images in conjunction with stereoviewing to produce an artificial stereo image effect. The technique, called through-focus dark field electron microscopy or 2-1/2D microscopy, basically involves obtaining two beam-tilted dark field images such that one is slightly over-focus and the other slightly under-focus, followed by examination of the two images through a conventional stereoviewer. The elevation differences so produced are usually unrelated to object positions in the thin foil and no specimen tilting is required.In order to produce this artificial stereo effect for the purpose of phase separation and identification, it is first necessary to select a region of the diffraction pattern containing more than just one discrete spot, with the objective aperture.

Phase identification in SiC whisker reinforced Al2O3-R2O3-based composites

1992 ◽  
Vol 50 (1) ◽  
pp. 152-153
Author(s):  
C.M. Sung ◽  
K.J. Ostreicher ◽  
M.L. Huckabee ◽  
S.T. Buljan
Keyword(s):  
Analytical Electron Microscopy ◽  
Phase Identification ◽  
Reinforced Composites ◽  
Ion Milling ◽  
X Ray ◽  
Binary Oxides ◽  
Analytical Electron ◽  
The Matrix ◽  
Second Phases ◽  
Convergent Beam

A series of binary oxides and SiC whisker reinforced composites both having a matrix composed of an α-(Al, R)2O3 solid solution (R: rare earth) have been studied by analytical electron microscopy (AEM). The mechanical properties of the composites as well as crystal structure, composition, and defects of both second phases and the matrix were investigated. The formation of various second phases, e.g. garnet, β-Alumina, or perovskite structures in the binary Al2O3-R2O3 and the ternary Al2O3-R2O3-SiC(w) systems are discussed.Sections of the materials having thicknesses of 100 μm - 300 μm were first diamond core drilled. The discs were then polished and dimpled. The final step was ion milling with Ar+ until breakthrough occurred. Samples prepared in this manner were then analyzed using the Philips EM400T AEM. The low-Z energy dispersive X-ray spectroscopy (EDXS) data were obtained and correlated with convergent beam electron diffraction (CBED) patterns to identify phase compositions and structures. The following EDXS parameters were maintained in the analyzed areas: accelerating voltage of 120 keV, sample tilt of 12° and 20% dead time.

Applications of SEM/EDXA in cement clinker investigation

1990 ◽  
Vol 48 (4) ◽  
pp. 870-871
Author(s):  
Arezki Tagnit-Hamou ◽  
Shondeep L. Sarkar
Keyword(s):  
Mineralogical Composition ◽  
Physicochemical Characteristics ◽  
Cement Clinker ◽  
Accurate Information ◽  
Phase Identification ◽  
History Of ◽  
Bulk Chemical ◽  
Resolution Imaging ◽  
Proven Method ◽  
Instantaneous Chemical

All the desired properties of cement primarily depend on the physicochemical characteristics of clinker from which the cement is produced. The mineralogical composition of the clinker forms the most important parameter influencing these properties.Optical microscopy provides reasonably accurate information pertaining to the thermal history of the clinker, while XRDA still remains the proven method of phase identification, and bulk chemical composition of the clinker can be readily obtained from XRFA. Nevertheless, all these microanalytical techniques are somewhat limited in their applications, and SEM/EDXA combination fills this gap uniquely by virtue of its high resolution imaging capability and possibility of instantaneous chemical analysis of individual phases.Inhomogeneities and impurities in the raw meal, influence of kiln conditions such as sintering and cooling rate being directly related to the microstructure can be effectively determined by SEM/EDXA. In addition, several physical characteristics of cement, such as rhcology, grindability and hydraulicity also depend on the clinker microstructure.

Security issues in Mobile Computing

2018 ◽  
Vol 8 (4) ◽  
pp. 13
Author(s):  
Kartik Khurana ◽  
Harpreet Kaur ◽  
Ritu Chauhan ◽  
Shalu Chauhan ◽  
Shaveta Bhatia ◽  
...  
Keyword(s):  
Mobile Computing ◽  
Mobile Devices ◽  
Mobile Communication ◽  
Internet Access ◽  
Mobile Security ◽  
Security Issue ◽  
Security Issues

Now a day’s mobile communication has become a serious business tool for the users. Mobile devices are mainly used for the applications like banking, e-commerce, internet access, entertainment, etc. for communication. This has become common for the user to exchange and transfer the data. However people are still facing problems to use mobile devices because of its security issue. This paper deals with various security issues in mobile computing. It also covers all the basic points which are useful in mobile security issues such as categorisation of security issues, methods or tactics for success in security issues in mobile computing, security frameworks.

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