Physical degradation of GaN HEMT device observed in TEM during reliability test
2009 ◽
Vol 49
(5)
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pp. 478-483
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2020 ◽
Vol 3
(1)
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pp. 11-20
1982 ◽
Vol 160
(3-4)
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pp. 171-178
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2011 ◽
Vol E94-C
(7)
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pp. 1193-1198
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2020 ◽
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