Radiometric calibration of CCD sensors: dark current and fixed pattern noise estimation

2004 ◽  
Author(s):  
A. Ortiz ◽  
G. Oliver
Keyword(s):  
Dark Current ◽  
Noise Estimation ◽  
Radiometric Calibration ◽  
Pattern Noise ◽  
Fixed Pattern Noise

Dark current fixed pattern noise reduction for the 2/3-in two-million pixel HDTV STACK-CCD imager

1997 ◽  
Vol 44 (10) ◽  
pp. 1658-1662 ◽  
Author(s):  
N. Sakaguchi ◽  
N. Nakamura ◽  
S. Ohsawa ◽  
Y. Endo ◽  
Y. Matsunaga ◽  
...  
Keyword(s):  
Noise Reduction ◽  
Dark Current ◽  
Pattern Noise ◽  
Fixed Pattern Noise

scholarly journals Averaging Pixel Current Adjustment Technique for Reducing Fixed Pattern Noise in the Bolometer-Type Uncooled Infrared Image Sensor

Sensors ◽  
2019 ◽  
Vol 19 (7) ◽  
pp. 1653
Author(s):  
Sang-Hwan Kim ◽  
Byoung-Soo Choi ◽  
Jimin Lee ◽  
Junwoo Lee ◽  
Jewon Lee ◽  
...  
Keyword(s):  
Dark Current ◽  
Small Deviation ◽  
Infrared Image ◽  
Image Sensor ◽  
Cmos Process ◽  
Readout Circuits ◽  
Active Pixel ◽  
Reference Pixel ◽  
Pattern Noise ◽  
Fixed Pattern Noise

In this paper, we propose an averaging pixel current adjustment technique for reducing fixed pattern noise (FPN) in the bolometer-type uncooled infrared image sensor. The averaging pixel current adjustment technique is composed of active pixel, reference pixel, and calibration circuit. Polysilicon resistors were used in each active pixel and reference pixel. Resistance deviation among active pixels integrated with the same resistance value cause FPN. The principle of the averaging pixel current adjustment technique for removing FPN is based on the subtraction of dark current of the active pixel from the dark current of the reference pixel. The subtracted current is converted into the voltage, which contains pixel calibration information. The calibration circuit is used to adjust the calibration current. After calibration, the nano-ampere current is output with small deviation. The proposed averaging pixel current adjustment technique is implemented by a chip composed of a pixel array, a calibration circuit, average current generators, and readout circuits. The chip was fabricated using a standard 0.35 μm CMOS process and its performance was evaluated.

scholarly journals Pixel Dark Current Calibration Method to Reduce Dark Fixed Pattern Noise in Amorphous Silicon Bolometer-type Uncooled Infrared Image Sensor

2020 ◽  
Vol 32 (10) ◽  
pp. 3261
Author(s):  
Sang-Hwan Kim ◽  
Jimin Lee ◽  
Hyeunwoo Kwen ◽  
Jae-Hyoun Park ◽  
Kyoung-Il Lee ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Dark Current ◽  
Infrared Image ◽  
Calibration Method ◽  
Image Sensor ◽  
Pattern Noise ◽  
Fixed Pattern Noise

Randomly-Accessible Active Pixel Sensor with Wide Dynamic Range and Reduced Fixed Pattern Noise

2021 ◽  
Author(s):  
Xiaolin Liu ◽  
Zhenhao Feng ◽  
Yihong Qi ◽  
Kuiren Su ◽  
Qian Li ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Wide Dynamic Range ◽  
Active Pixel Sensor ◽  
Active Pixel ◽  
Pattern Noise ◽  
Fixed Pattern Noise

A 0.5 V PWM CMOS Imager With 82 dB Dynamic Range and 0.055% Fixed-Pattern-Noise

2013 ◽  
Vol 48 (10) ◽  
pp. 2522-2530 ◽  
Author(s):  
Meng-Ting Chung ◽  
Chih-Lin Lee ◽  
Chin Yin ◽  
Chih-Cheng Hsieh
Keyword(s):  
Dynamic Range ◽  
Cmos Imager ◽  
Pattern Noise ◽  
Fixed Pattern Noise
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