scholarly journals Pixel Dark Current Calibration Method to Reduce Dark Fixed Pattern Noise in Amorphous Silicon Bolometer-type Uncooled Infrared Image Sensor

2020 ◽  
Vol 32 (10) ◽  
pp. 3261
Author(s):  
Sang-Hwan Kim ◽  
Jimin Lee ◽  
Hyeunwoo Kwen ◽  
Jae-Hyoun Park ◽  
Kyoung-Il Lee ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Dark Current ◽  
Infrared Image ◽  
Calibration Method ◽  
Image Sensor ◽  
Pattern Noise ◽  
Fixed Pattern Noise

scholarly journals Averaging Pixel Current Adjustment Technique for Reducing Fixed Pattern Noise in the Bolometer-Type Uncooled Infrared Image Sensor

Sensors ◽  
2019 ◽  
Vol 19 (7) ◽  
pp. 1653
Author(s):  
Sang-Hwan Kim ◽  
Byoung-Soo Choi ◽  
Jimin Lee ◽  
Junwoo Lee ◽  
Jewon Lee ◽  
...  
Keyword(s):  
Dark Current ◽  
Small Deviation ◽  
Infrared Image ◽  
Image Sensor ◽  
Cmos Process ◽  
Readout Circuits ◽  
Active Pixel ◽  
Reference Pixel ◽  
Pattern Noise ◽  
Fixed Pattern Noise

In this paper, we propose an averaging pixel current adjustment technique for reducing fixed pattern noise (FPN) in the bolometer-type uncooled infrared image sensor. The averaging pixel current adjustment technique is composed of active pixel, reference pixel, and calibration circuit. Polysilicon resistors were used in each active pixel and reference pixel. Resistance deviation among active pixels integrated with the same resistance value cause FPN. The principle of the averaging pixel current adjustment technique for removing FPN is based on the subtraction of dark current of the active pixel from the dark current of the reference pixel. The subtracted current is converted into the voltage, which contains pixel calibration information. The calibration circuit is used to adjust the calibration current. After calibration, the nano-ampere current is output with small deviation. The proposed averaging pixel current adjustment technique is implemented by a chip composed of a pixel array, a calibration circuit, average current generators, and readout circuits. The chip was fabricated using a standard 0.35 μm CMOS process and its performance was evaluated.

Dark current fixed pattern noise reduction for the 2/3-in two-million pixel HDTV STACK-CCD imager

1997 ◽  
Vol 44 (10) ◽  
pp. 1658-1662 ◽  
Author(s):  
N. Sakaguchi ◽  
N. Nakamura ◽  
S. Ohsawa ◽  
Y. Endo ◽  
Y. Matsunaga ◽  
...  
Keyword(s):  
Noise Reduction ◽  
Dark Current ◽  
Pattern Noise ◽  
Fixed Pattern Noise

scholarly journals CMOS Fixed Pattern Noise Removal Based on Low Rank Sparse Variational Method

2020 ◽  
Vol 10 (11) ◽  
pp. 3694
Author(s):  
Tao Zhang ◽  
Xinyang Li ◽  
Jianfeng Li ◽  
Zhi Xu
Keyword(s):  
Variational Method ◽  
Noise Removal ◽  
Correction Method ◽  
Image Sensor ◽  
Low Rank ◽  
Statistical Characteristics ◽  
Parameter Adjustment ◽  
Structure Information ◽  
Pattern Noise ◽  
Fixed Pattern Noise

Fixed pattern noise (FPN) has always been an important factor affecting the imaging quality of CMOS image sensor (CIS). However, the current scene-based FPN removal methods mostly focus on the image itself, and seldom consider the structure information of the FPN, resulting in various undesirable noise removal effects. This paper presents a scene-based FPN correction method: the low rank sparse variational method (LRSUTV). It combines not only the continuity of the image itself, but also the structural and statistical characteristics of the stripes. At the same time, the low frequency information of the image is combined to achieve adaptive adjustment of some parameters, which simplifies the process of parameter adjustment, to a certain extent. With the help of adaptive parameter adjustment strategy, LRSUTV shows good performance under different intensity of stripe noise, and has high robustness.

scholarly journals A Fixed-Pattern Noise Correction Method Based on Gray Value Compensation for TDI CMOS Image Sensor

Sensors ◽  
2015 ◽  
Vol 15 (9) ◽  
pp. 23496-23513 ◽  
Author(s):  
Zhenwang Liu ◽  
Jiangtao Xu ◽  
Xinlei Wang ◽  
Kaiming Nie ◽  
Weimin Jin
Keyword(s):  
Cmos Image Sensor ◽  
Correction Method ◽  
Image Sensor ◽  
Pattern Noise ◽  
Fixed Pattern Noise ◽  
Noise Correction

Current Mode Image Sensor With Improved Linearity and Fixed-Pattern Noise

2014 ◽  
Vol 61 (6) ◽  
pp. 1666-1674 ◽  
Author(s):  
Xiaotie Wu ◽  
Xilin Liu ◽  
Milin Zhang ◽  
Jan Van der Spiegel
Keyword(s):  
Current Mode ◽  
Image Sensor ◽  
Pattern Noise ◽  
Fixed Pattern Noise
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