Impact of MOSFET gate-oxide reliability on CMOS operational amplifiers in a 130-nm low-voltage CMOS process
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2005 ◽
Vol 45
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pp. 479-485
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2008 ◽
Vol 8
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pp. 394-405
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2006 ◽
Vol 41
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2013 ◽
Vol 284-287
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pp. 2502-2508