Defect passivation and dark count in Geiger-mode avalanche photodiodes

2003 ◽  
Author(s):  
J.C. Jackson ◽  
G. Healy ◽  
A.-M. Kelleher ◽  
J. Alderman ◽  
J. Donnelly ◽  
...  
Keyword(s):  
Avalanche Photodiodes ◽  
Dark Count ◽  
Defect Passivation ◽  
Geiger Mode

Analysis of Dark Count Mechanisms of 4H-SiC Ultraviolet Avalanche Photodiodes Working in Geiger Mode

2017 ◽  
Vol 64 (11) ◽  
pp. 4532-4539 ◽  
Author(s):  
Sen Yang ◽  
Dong Zhou ◽  
Xiaolong Cai ◽  
Weizong Xu ◽  
Hai Lu ◽  
...  
Keyword(s):  
Avalanche Photodiodes ◽  
Dark Count ◽  
Geiger Mode

scholarly journals Low Dark Count Geiger Mode Avalanche Photodiodes Fabricated in Conventional CMOS Technologies

2011 ◽  
Vol 9 (6) ◽  
pp. 2408-2411
Author(s):  
E. Vilella ◽  
A. Arbat ◽  
O. Alonso ◽  
A. Comerma ◽  
J. Trenado ◽  
...  
Keyword(s):  
Avalanche Photodiodes ◽  
Dark Count ◽  
Geiger Mode

Influence of Defects in 4H-SiC Avalanche Photodiodes on Geiger-Mode Dark Count Probability

2009 ◽  
Vol 615-617 ◽  
pp. 877-880 ◽  
Author(s):  
Alexey V. Vert ◽  
Stanislav I. Soloviev ◽  
Jody Fronheiser ◽  
Peter M. Sandvik
Keyword(s):  
Single Photon ◽  
Avalanche Photodiodes ◽  
Single Photon Detection ◽  
Induced Current ◽  
Dark Count ◽  
Device Structure ◽  
Photon Detection ◽  
Avalanche Diodes ◽  
Geiger Mode ◽  
Electron Beam Induced Current

4H-SiC single photon avalanche diodes are reported. A separate absorption and multiplication non-reach through device structure was optimized for operation in Geiger mode. An estimated dark current at a gain of 1000 was ranging between 0.4 pA (0.75 nA/cm2) and 20nA (38 A/cm2) on devices with an effective mesa diameter of 260 m. The electron beam induced current technique was used to image defects in the active region of studied devices. Increased reverse bias leakage current and increased Geiger mode dark count probability were correlated with the presence of large number of defects. Single photon detection efficiencies of up to 11% were measured at a wavelength of 266 nm in Geiger mode.

Comparing leakage currents and dark count rates in Geiger-mode avalanche photodiodes

2002 ◽  
Vol 80 (22) ◽  
pp. 4100-4102 ◽  
Author(s):  
J. C. Jackson ◽  
P. K. Hurley ◽  
B. Lane ◽  
A. Mathewson ◽  
A. P. Morrison
Keyword(s):  
Avalanche Photodiodes ◽  
Dark Count ◽  
Leakage Currents ◽  
Geiger Mode

Low dark count rate 4H-SiC Geiger mode avalanche photodiodes operated under gated quenching at 325nm

2006 ◽  
Author(s):  
Ariane L. Beck ◽  
Xiangyi Guo ◽  
Han-Din Liu ◽  
Aruna Ghatak-roy ◽  
Joe C. Campbell
Keyword(s):  
Count Rate ◽  
Avalanche Photodiodes ◽  
Dark Count ◽  
Dark Count Rate ◽  
Geiger Mode

scholarly journals Simulation of Dark Count in Geiger Mode Avalanche Photodiodes

2001 ◽  
pp. 376-379 ◽  
Author(s):  
J. C. Jackson ◽  
B. Lane ◽  
A. Mathewson ◽  
A. P. Morrison
Keyword(s):  
Avalanche Photodiodes ◽  
Dark Count ◽  
Geiger Mode

Afterpulsing in Geiger-mode avalanche photodiodes for 1.06μm wavelength

2006 ◽  
Vol 88 (13) ◽  
pp. 133503 ◽  
Author(s):  
K. E. Jensen ◽  
P. I. Hopman ◽  
E. K. Duerr ◽  
E. A. Dauler ◽  
J. P. Donnelly ◽  
...  
Keyword(s):  
Avalanche Photodiodes ◽  
Geiger Mode
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