Leakage behavior and reliability assessment of tantalum oxide dielectric MIM capacitors
Electrical properties in low temperature range (5K–300K) of Tantalum Oxide dielectric MIM capacitors
2005 ◽
Vol 45
(5-6)
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pp. 925-928
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Keyword(s):
1999 ◽
Vol 119
(12)
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pp. 1554-1555
1991 ◽
Vol 1991
(170)
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pp. 483-491
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2013 ◽
Vol 1
(3)
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pp. 1-7
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