Evidence for hydrogen-related defects during NBTl stress in p-MOSFETs

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. ◽

10.1109/relphy.2003.1197741 ◽

2003 ◽

Cited By ~ 47

Author(s):

V. Huard ◽

F. Monsieur ◽

G. Ribes ◽

S. Bruyere

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